
Failures in Photovoltaic Modules
21 Apr 2015  Online Presentations  Contributor(s): Peter Bermel
In this talk, I will discuss some of the major sources of performance degradation for common glassencapsulated PV modules, including crystalline silicon and thin films. The greatest reliability...
http://nanohub.org/resources/22193

ECE 695A Lecture 37: Radiation Induced Damage – An overview
20 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Introduction and short history of radiation damage
Radiation damage in various types of components
Sources of radiation
A basic calculation and simulation...
http://nanohub.org/resources/17638

ECE 695A Lecture 37R: Review Questions
20 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Review Questions:
Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?
What type of radiation issues could arise for thinbody...
http://nanohub.org/resources/17639

ECE 695A Lecture 34: Scaling Theory of Design of Experiments
18 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Introduction
Buckingham PI Theorem
An Illustrative Example
Recall the scaling theory of HCI, NBTI, and TDDB
Conclusions
http://nanohub.org/resources/17617

ECE 695A Lecture 34A: Appendix  Variability by Bootstrap Method
18 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
http://nanohub.org/resources/17618

ECE 695A Lecture 33: Model Selection/Goodness of Fit
18 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
The problem of matching data with theoretical distribution
Parameter extractions: Moments, linear regression, maximum likelihood
Goodness of fit: Residual, Pearson, Cox,...
http://nanohub.org/resources/17615

ECE 695A Lecture 33R: Review Questions
18 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Review Questions:
With higher number of model parameters, you can always get a good fit – why should you minimize the number of parameters
Least square method is a subset of maximum...
http://nanohub.org/resources/17616

ECE 695A Lecture 32R: Review Questions
17 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Review Questions:
Why do people use Normal, lognormal, Weibull distributions when they do not know the exact physical distribution?
What is the problem of using empirical distributions?...
http://nanohub.org/resources/17586

ECE 695A Lecture 32: Physical vs. Empirical Distribution
17 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Physical Vs. empirical distribution
Properties of classical distribution function
Momentbased fitting of data
Conclusions
http://nanohub.org/resources/17585

ECE 695A Lecture 31R: Review Questions
15 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Review Questions:
What is the difference between parametric estimation vs. nonparametric estimation?
What principle did Tacho Brahe’s approach assume?
What is the difference between...
http://nanohub.org/resources/17584

ECE 695A Lecture 31: Collecting and Plotting Data
15 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Origin of data, Field Acceleration vs. Statistical Inference
Nonparametric information
Preparing data for projection: Hazen formula
Preparing data for projection: Kaplan...
http://nanohub.org/resources/17582

ECE 695A Lecture 31A: Appendix  Bootstrap Method Introduction
15 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
http://nanohub.org/resources/17583

ECE 695A Lecture 30R: Review Questions
08 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
What is the difference between extrinsic vs. intrinsic breakdown?
Does gas dielectric have extrinsic breakdown? Why or why not?
What does ESD damage and the plasma damage to thin...
http://nanohub.org/resources/17487

ECE 695A Lecture 30: Breakdown in Dielectrics with Defects
08 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Introduction
Theory of preexisting defects: Thin oxides
Theory of preexisting defects: thick oxides
Conclusions
http://nanohub.org/resources/17486

ECE 695A Lecture 29R: Review Questions
08 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Review Questions:
Mention a few differences between thick and thin oxide breakdown.
Is breakdown in thick oxides contact dominated? Can I use AHI theory here?
How does the Paschen’s...
http://nanohub.org/resources/17485

ECE 695A Lecture 29A: Appendix  Dimension of a Surface
08 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
http://nanohub.org/resources/17484

ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown
08 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Part 1  Understanding PostBD FET behavior
BD position determination
Hard and Soft BD in FETs
Distinguishing leakage and intrinsic FET parameters shifts
Part 2  Impact of...
http://nanohub.org/resources/17482

ECE 695A Lecture 29: Breakdown of Thick Dielectrics
08 Apr 2013  Online Presentations  Contributor(s): Muhammad Alam
Outline:
Introduction
Spatial and temporal dynamics during breakdown
Breakdown in bulk oxides: puzzle
Conclusions
http://nanohub.org/resources/17483

ECE 695A Lecture 27: Correlated TDDB in OffState HCI
29 Mar 2013  Online Presentations  Contributor(s): Muhammad Alam
http://nanohub.org/resources/17444

ECE 695A Lecture 27R: Review Questions
29 Mar 2013  Online Presentations  Contributor(s): Muhammad Alam
http://nanohub.org/resources/17448