Tags: reliability

Resources (41-60 of 98)

  1. ECE 695A Lecture 27: Correlated TDDB in Off-State HCI

    29 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17444

  2. ECE 695A Lecture 27R: Review Questions

    29 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17448

  3. ECE 695A Lecture 28: Circuit Implications of Dielectric Breakdown

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Part 1 - Understanding Post-BD FET behavior BD position determination Hard and Soft BD in FETs Distinguishing leakage and intrinsic FET parameters shifts Part 2 - Impact of...

    http://nanohub.org/resources/17482

  4. ECE 695A Lecture 29: Circuit Implications of Dielectric Breakdown

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Conclusions

    http://nanohub.org/resources/17483

  5. ECE 695A Lecture 29A: Appendix - Dimension of a Surface

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17484

  6. ECE 695A Lecture 29R: Review Questions

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Mention a few differences between thick and thin oxide breakdown. Is breakdown in thick oxides contact dominated? Can I use AHI theory here? How does the Paschen’s...

    http://nanohub.org/resources/17485

  7. ECE 695A Lecture 2: A Brief History of Reliability and Types of Reliability Models

    16 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Reliability as a General Phenomena A Brief History of Reliability Approaches to Reliability Physics Conclusions

    http://nanohub.org/resources/16545

  8. ECE 695A Lecture 30: Breakdown in Dielectrics with Defects

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction Theory of pre-existing defects: Thin oxides Theory of pre-existing defects: thick oxides Conclusions

    http://nanohub.org/resources/17486

  9. ECE 695A Lecture 30R: Review Questions

    08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: What is the difference between extrinsic vs. intrinsic breakdown? Does gas dielectric have extrinsic breakdown? Why or why not? What does ESD damage and the plasma damage to thin...

    http://nanohub.org/resources/17487

  10. ECE 695A Lecture 31: Collecting and Plotting Data

    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Origin of data, Field Acceleration vs. Statistical Inference Nonparametric information Preparing data for projection: Hazen formula Preparing data for projection: Kaplan...

    http://nanohub.org/resources/17582

  11. ECE 695A Lecture 31A: Appendix - Bootstrap Method Introduction

    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17583

  12. ECE 695A Lecture 31R: Review Questions

    15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the difference between parametric estimation vs. non-parametric estimation? What principle did Tacho Brahe’s approach assume? What is the difference between...

    http://nanohub.org/resources/17584

  13. ECE 695A Lecture 32: Physical vs. Empirical Distribution

    17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Physical Vs. empirical distribution Properties of classical distribution function Moment-based fitting of data Conclusions

    http://nanohub.org/resources/17585

  14. ECE 695A Lecture 32R: Review Questions

    17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution? What is the problem of using empirical distributions?...

    http://nanohub.org/resources/17586

  15. ECE 695A Lecture 33: Model Selection/Goodness of Fit

    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: The problem of matching data with theoretical distribution Parameter extractions: Moments, linear regression, maximum likelihood Goodness of fit: Residual, Pearson, Cox,...

    http://nanohub.org/resources/17615

  16. ECE 695A Lecture 33R: Review Questions

    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: With higher number of model parameters, you can always get a good fit – why should you minimize the number of parameters Least square method is a subset of maximum...

    http://nanohub.org/resources/17616

  17. ECE 695A Lecture 34: Scaling Theory of Design of Experiments

    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction Buckingham PI Theorem An Illustrative Example Recall the scaling theory of HCI, NBTI, and TDDB Conclusions

    http://nanohub.org/resources/17617

  18. ECE 695A Lecture 34A: Appendix - Variability by Bootstrap Method

    18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17618

  19. ECE 695A Lecture 37: Radiation Induced Damage – An overview

    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Introduction and short history of radiation damage Radiation damage in various types of components Sources of radiation A basic calculation and simulation...

    http://nanohub.org/resources/17638

  20. ECE 695A Lecture 37R: Review Questions

    20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET? What type of radiation issues could arise for thin-body...

    http://nanohub.org/resources/17639