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ECE 695A Lecture 26-2: Statistics of Soft Breakdown (Breakdown Position correlation)
28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Position and time correlation of BD spot How to determine the position of the BD Spot Position correlation in BD spots Why is localization so weak? Conclusions
https://nanohub.org/resources/17419
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ECE 695A Lecture 26R: Review Questions
28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/17420
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ECE 695A Lecture 25R: Review Questions
27 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions: Explain why percolation resistance is area independent? Why is the physical origin of the distribution of percolation resistance? How would the ratio of hard and soft breakdown …
https://nanohub.org/resources/17296
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ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model
21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Observations: Failure times are statistically distributed Models of Failure Distribution: Extrinsic vs. percolation Percolation theory of multiple Breakdown TDDB lifetime projection …
https://nanohub.org/resources/17293
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ECE 695A Lecture 24R: Review Questions
21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/17294
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ECE 695A Lecture 25: Theory of Soft and Hard Breakdown
21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Oxide breakdowns need not be catastrophic Observations about soft vs. hard breakdown A simple model for soft/hard breakdown Interpretation of experiments Conclusions
https://nanohub.org/resources/17295
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ECE 695A Lecture 23R: Review Questions
19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/17292
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ECE 695A Lecture 22R: Review Questions
19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/17290
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ECE 695A Lecture 23: Characterization of Defects Responsible for TDDB
19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/17291
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ECE 695A Lecture 21R: Review Questions
12 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions: What is the name of the failure distribution that we expect for thin oxides? For thin oxides, is PMOS or NMOS more of a concern in modern transistors? What is DBIE? When …
https://nanohub.org/resources/17249
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ECE 695A Lecture 21: Introduction to Dielectric Breakdown
05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Basic features of gate dielectric breakdown Physical characterization of breakdown spot Time-dependent defect generation Conclusions
https://nanohub.org/resources/17027
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ECE 695A Lecture 22: Voltage Dependence of Thin Dielectric Breakdown
05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/17028
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ECE 695A Lecture 19R: Review Questions
04 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:: If a signal disappears from ESR because of negative-U configuration, can it be detected by SDR or EDSR methods? What is the relationship between Gauss and Tesla as units of …
https://nanohub.org/resources/17196
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ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance
01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Importance of measuring interface damage Electronic Spin Resonance ( A quick review) Spin Dependent Recombination Electrically detected spin-resonance and noise- spectroscopy …
https://nanohub.org/resources/17024
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ECE 695A Lecture 17R: Review Questions
01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions: What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation? Why do people like to use C-V techniques? What method would you use for HCI …
https://nanohub.org/resources/17155
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ECE 695A Lecture 18R: Review Questions
01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions: Between DCIV and CP methods, which one is easier and why? In what ways are CP and DCIV methods better at characterizing traps compared to C-V methods? What are the problems …
https://nanohub.org/resources/17159
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ECE 695A Lecture 18: DC-IV and Charge Pumping Methods
25 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline: Recall: Properties of Interface Defects Flux-based method 1: Direct Current-Voltage method Flux-based method 2: Charge pumping method Conclusions
https://nanohub.org/resources/17023
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ECE 695A Lecture 16: Review Questions
22 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Question What is the difference between hot atom dissociation vs. cold atom dissociation?. Many experiments are reported at 77K and 295K. Why these temperatures?. Why is there such a …
https://nanohub.org/resources/17014
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ECE 695A Lecture 17: Subtheshold and Idlin Methods
21 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
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https://nanohub.org/resources/16965
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ECE 695A Lecture 15R: Review Questions
20 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions: Why is BTBT tunneling important for OFF-state HCI, but nor for ON-state HCI? What type of bond dissociation dominated DeMOS degradation? Provide two supporting arguments. …
https://nanohub.org/resources/16933