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  1. Modeling Interface-defect Generation (MIG)

    This resource has a 9.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

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    Total: updated 27 Jul 2014
    Users: 494
    Reviews & Citations
    Avg. Review: 4.0 out of 5 stars
    Citations:

    18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

    http://nanohub.org/resources/devrel

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