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  1. Modeling Interface-defect Generation (MIG)

    This resource has a 9.4 Ranking

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    18 Jul 2006 | Tools | Contributor(s): Ahmad Ehteshamul Islam, Haldun Kufluoglu, Muhammad A. Alam

    Analyzes device reliability based on NBTI

    http://nanohub.org/resources/devrel

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