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Tags: reliability

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  1. ECE 695A Lecture 27: Correlated TDDB in Off-State HCI

    29 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17444

  2. ECE 695A Lecture 27R: Review Questions

    29 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17448

  3. ECE 695A Lecture 26-1: Statistics of Soft Breakdown via Methods of Markov Chains

    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Spatial vs. Temporal correlation Theory of correlated Dielectric Breakdown Excess leakage as a signature of correlated BD Conclusions

    http://nanohub.org/resources/17418

  4. ECE 695A Lecture 26-2: Statistics of Soft Breakdown (Breakdown Position correlation)

    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Position and time correlation of BD spot How to determine the position of the BD Spot Position correlation in BD spots Why is localization so weak? Conclusions

    http://nanohub.org/resources/17419

  5. ECE 695A Lecture 26R: Review Questions

    28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17420

  6. ECE 695A Lecture 25R: Review Questions

    27 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Explain why percolation resistance is area independent? Why is the physical origin of the distribution of percolation resistance? How would the ratio of hard and soft...

    http://nanohub.org/resources/17296

  7. ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Observations: Failure times are statistically distributed Models of Failure Distribution: Extrinsic vs. percolation Percolation theory of multiple Breakdown TDDB lifetime...

    http://nanohub.org/resources/17293

  8. ECE 695A Lecture 24R: Review Questions

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17294

  9. ECE 695A Lecture 25: Theory of Soft and Hard Breakdown

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Oxide breakdowns need not be catastrophic Observations about soft vs. hard breakdown A simple model for soft/hard breakdown Interpretation of experiments Conclusions

    http://nanohub.org/resources/17295

  10. ECE 695A Lecture 23R: Review Questions

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17292

  11. ECE 695A Lecture 22R: Review Questions

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17290

  12. ECE 695A Lecture 23: Characterization of Defects Responsible for TDDB

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17291

  13. ECE 695A Lecture 21R: Review Questions

    12 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the name of the failure distribution that we expect for thin oxides? For thin oxides, is PMOS or NMOS more of a concern in modern transistors? What is DBIE? When...

    http://nanohub.org/resources/17249

  14. ECE 695A Lecture 21: Introduction to Dielectric Breakdown

    05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Basic features of gate dielectric breakdown Physical characterization of breakdown spot Time-dependent defect generation Conclusions

    http://nanohub.org/resources/17027

  15. ECE 695A Lecture 22: Voltage Dependence of Thin Dielectric Breakdown

    05 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    http://nanohub.org/resources/17028

  16. ECE 695A Lecture 19R: Review Questions

    04 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions:: If a signal disappears from ESR because of negative-U configuration, can it be detected by SDR or EDSR methods? What is the relationship between Gauss and Tesla as units...

    http://nanohub.org/resources/17196

  17. ECE 695A Lecture 19: Spin-Dependent Recombination and Electrically Detected Magnetic Resonance

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Importance of measuring interface damage Electronic Spin Resonance ( A quick review) Spin Dependent Recombination Electrically detected spin-resonance and noise-...

    http://nanohub.org/resources/17024

  18. ECE 695A Lecture 17R: Review Questions

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation? Why do people like to use C-V techniques? What method would you use for HCI...

    http://nanohub.org/resources/17155

  19. ECE 695A Lecture 18R: Review Questions

    01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Between DCIV and CP methods, which one is easier and why? In what ways are CP and DCIV methods better at characterizing traps compared to C-V methods? What are the...

    http://nanohub.org/resources/17159

  20. ECE 695A Lecture 18: DC-IV and Charge Pumping Methods

    25 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Recall: Properties of Interface Defects Flux-based method 1: Direct Current-Voltage method Flux-based method 2: Charge pumping method Conclusions

    http://nanohub.org/resources/17023

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