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Tags: reliability

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  1. ECE 695A Lecture 8: Phenomenological Observations for NBTI

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Qualitative observations Time, voltage, temperature dependencies Material dependence Circuit implications

    http://nanohub.org/resources/16665

  2. ECE 695A Lecture 8R: Review Questions

    01 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam

    What is the distinction between BTI and NBTI phenomena? What does it mean that a process is thermally activated? What is the difference between parametric failure and catastrophic failure?...

    http://nanohub.org/resources/16666

  3. ECE 695A Lecture 5: Amorphous Material/Interfaces

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Amorphous vs. crystalline materials Defect-free amorphous material Origin of defects (Maxwell’s relation) Conclusions

    http://nanohub.org/resources/16548

  4. ECE 695A Lecture 7: Trapping in Pre-existing Traps

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Pre-existing vs. stress-induced traps Voltage-shift in pre-existing bulk/interface traps Random Telegraph Noise, 1/f noise Conclusion

    http://nanohub.org/resources/16609

  5. ECE 695A Lecture 7A: Appendix - Theory of Stochastic Distribution

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Supplemental information for Lecture 7: Trapping in Pre-existing Traps

    http://nanohub.org/resources/16611

  6. ECE 695A Lecture 7R: Review Questions

    29 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: Why are there more types of defects in crystals than in amorphous material? From the perspective of Maxwell’s relation, how does H reduce defect density? Why is HfO2 so...

    http://nanohub.org/resources/16615

  7. ECE 695A Lecture 3: Reliability as a Threshold Problem

    17 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Reliability as a Threshold Problem: Empirical vs. Physical Models ‘Blind Fish in a Waterfall’ as a prototype for Accelerated Testing/Statistical distribution Four elements of...

    http://nanohub.org/resources/16546

  8. ECE 695A Lecture 4: Structures and Defects in Crystals

    17 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Background information Defect-free crystal structures Defects in crystals Conclusions

    http://nanohub.org/resources/16547

  9. ECE 695A Reliability Physics of Nanotransistors

    17 Jan 2013 | Courses | Contributor(s): Muhammad Alam

    This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, the students learn how to compute current through a device when a...

    http://nanohub.org/resources/16560

  10. ECE 695A Lecture 2: A Brief History of Reliability and Types of Reliability Models

    16 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Reliability as a General Phenomena A Brief History of Reliability Approaches to Reliability Physics Conclusions

    http://nanohub.org/resources/16545

  11. ECE 695A Lecture 1: Reliability of Nanoelectronic Devices

    11 Jan 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Evolving Landscape of Electronics Performance, Variability, and Reliability Classification of Reliability Course Information Conclusions

    http://nanohub.org/resources/16511

  12. In Search of a Better MEMS-Switch: An Elementary theory of how nanostructured dielectrics may soften landing, increase travel range, and decrease energy dissipation

    06 Jun 2012 | Online Presentations | Contributor(s): Muhammad Alam

    In this talk, I will discuss an elementary theory of the role of nanostructured electrodes in addressing some of the challenges from a fundamentally different perspective. The goal is to start a...

    http://nanohub.org/resources/13899

  13. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling

    28 Mar 2012 | Courses | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    http://nanohub.org/resources/13613

  14. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Fast and Ultra-fast Characterization Methods (Part 1 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    http://nanohub.org/resources/13614

  15. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Predictive Modeling (Part 3 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it has...

    http://nanohub.org/resources/13612

  16. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: The Impact of Gate Insulator Processes (Part 2 of 3)

    28 Mar 2012 | Online Presentations | Contributor(s): Souvik Mahapatra

    This presentation is part 2 on Negative Bias Temperature Instability (NBTI), observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10 years it...

    http://nanohub.org/resources/13611

  17. Verification and Validation in Simulations of Complex Engineered Systems

    03 Jan 2012 | Online Presentations | Contributor(s): Robert Moser

    Computational simulation is a ubiquitous tool in engineering. Further, the explosion of computational capabilities over the last several decades has resulted in the use of computational models of...

    http://nanohub.org/resources/12525

  18. Jeremy M Gernand

    Jeremy Gernand is currently an Assistant Professor of Industrial Health and Safety at Penn State University. He is currently pursuing research related to the occupational hazards of exposure to...

    http://nanohub.org/members/61288

  19. Theory and characterization of random defect formation and its implication in variability of nanoscale transistors

    30 Sep 2011 | Papers | Contributor(s): Ahmad Ehteshamul Islam

    Over the last 50 years, carrier transport has been the central research topic in the semiconductor area. The outcome was a dramatic improvement in the performance of a transistor, which is one of...

    http://nanohub.org/resources/12182

  20. A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells

    16 Aug 2011 | Online Presentations | Contributor(s): Sourabh Dongaonkar, Souvik Mahapatra, Karthik Yogendra, Muhammad Alam

    In this talk we develop a coherent physics based understanding of the shunt leakage problem in a-Si:H cells, and discuss its implications on cell and module level. Sourabh Dongaonkar is with...

    http://nanohub.org/resources/11841

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