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Tags: reliability

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  1. Negative Bias Temperature Instability (NBTI) in p-MOSFETs: Characterization, Material/Process Dependence and Predictive Modeling (2011)

    11 May 2011 | Online Presentations | Contributor(s): Souvik Mahapatra

    This is a presentation on Negative Bias Temperature Instability, or in short NBTI, observed in p channel MOSFET devices. Though NBTI has been discovered more than 40 years ago, in the last 10...

    http://nanohub.org/resources/11249

  2. Lecture 9: Breakdown in Thick Dielectrics

    05 Apr 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Breakdown in gas dielectric and Paschen’s law Spatial and temporal dynamics during breakdown Breakdown in bulk oxides: puzzle Theory of pre-existing defects: Thin oxides Theory of...

    http://nanohub.org/resources/7177

  3. Lecture 8: Mechanics of Defect Generation and Gate Dielectric Breakdown

    10 Mar 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    http://nanohub.org/resources/7176

  4. Lecture 10: Interface Damage & Negative Bias Temperature Instability

    02 Feb 2010 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Background information NBTI interpreted by R-D model The act of measurement and observed quantity NBTI vs. Light-induced Degradation Possibility of Degradation-free...

    http://nanohub.org/resources/7178

  5. Lecture 6: 3D Nets in a 3D World: Bulk Heterostructure Solar Cells

    27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Introduction: 

definitions
 and
 review
 Reaction
 diffusion
 in 
fractal 
volumes Carrier
 transport
 in 
BH
 solar 
cells All
 phase
 transitions 
are
 not
 fractal Conclusions

    http://nanohub.org/resources/7174

  6. Lecture 5: 2D Nets in a 3D World: Basics of Nanobiosensors and Fractal Antennae

    27 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Background:
 A
 different
 type
 of
 transport
 problem
 Example:
 Classical
 biosensors Fractal 
dimension
 and
 cantor
 transform Example:
 fractal...

    http://nanohub.org/resources/7173

  7. Lecture 4: Stick Percolation and Nanonet Electronics

    26 Oct 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Outline: Stick percolation and nanonet transistors Short channel nanonet transistors Long channel nanonet transistors Transistors at high voltages Conclusions

    http://nanohub.org/resources/7172

  8. 2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    22 Sep 2009 | Workshops | Contributor(s): Supriyo Datta, Mark Lundstrom, Muhammad A. Alam, Joerg Appenzeller

    The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on...

    http://nanohub.org/resources/7113

  9. Lecture 1: Percolation and Reliability of Electronic Devices

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    http://nanohub.org/resources/7169

  10. Lecture 2: Threshold, Islands, and Fractals

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    http://nanohub.org/resources/7170

  11. Lecture 3: Electrical Conduction in Percolative Systems

    17 Sep 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    Network for Computational Nanotechnology, Intel Foundation

    http://nanohub.org/resources/7171

  12. Nanostructured Electronic Devices: Percolation and Reliability

    17 Sep 2009 | Courses | Contributor(s): Muhammad A. Alam

    In this series of lectures introduces a simple theoretical framework for treating randomness and variability in emerging nanostructured electronic devices for wide ranging applications – all...

    http://nanohub.org/resources/7168

  13. Jul 20 2009

    2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    Electronics from the Bottom Up seeks to bring a new perspective to engineering education -- one that is designed to help realize the opportunities of nanotechnology. Ever since the birth of...

    http://nanohub.org/events/details/231

  14. The Challenges of Micro-System Product Development

    05 Jun 2009 | Online Presentations | Contributor(s): James J. Allen

    This talk will discuss the historical development of micro‐system technology, the products that have been developed and the challenges to development of a reliable product.

    http://nanohub.org/resources/6848

  15. ECE 606 Lecture 39: Reliability of MOSFET

    28 Apr 2009 | Online Presentations | Contributor(s): Muhammad A. Alam

    http://nanohub.org/resources/5908

  16. Experiences with nonintrusive polynomial Chaos and stochastic collocation methods for uncertainty analysis and design

    13 Mar 2009 | Online Presentations | Contributor(s): Michael S. Eldred

    Non—intrusive polynomial chaos expansion (PCE) and stochastic collocation (SC) methods are attractive techniques for uncertainty quantification due to their abilities to produce functional...

    http://nanohub.org/resources/5910

  17. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    14 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

    http://nanohub.org/resources/5861

  18. PRISM Seminar Series

    05 Nov 2008 | Series | Contributor(s): Jayathi Murthy, Alejandro Strachan

    Welcome to the PRISM Seminar Series. PRIMS: NNSA Center for Prediction of Reliability, Integrity and Survivability of Microsystems, is a university center funded by the Department of Energy's...

    http://nanohub.org/resources/5699

  19. From density functional theory to defect level in silicon: Does the “band gap problem” matter?

    01 Oct 2008 | Online Presentations | Contributor(s): Peter A. Schultz

    Modeling the electrical effects of radiation damage in semiconductor devices requires a detailed description of the properties of point defects generated during and subsequent to irradiation....

    http://nanohub.org/resources/5495

  20. Reliability Physics of Nanoscale Transistors

    27 Nov 2007 | Courses | Contributor(s): Muhammad A. Alam

    This course will focus on the physics of reliability of small semiconductor devices. In traditional courses on device physics, we learn how to compute current through a device when a voltage is...

    http://nanohub.org/resources/3587

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