Tags: reliability

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  1. Jul 20 2009

    2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    Electronics from the Bottom Up seeks to bring a new perspective to engineering education -- one that is designed to help realize the opportunities of nanotechnology. Ever since the birth of...

    https://nanohub.org/events/details/231

  2. 2009 NCN@Purdue Summer School: Electronics from the Bottom Up

    22 Sep 2009 | | Contributor(s):: Supriyo Datta, Mark Lundstrom, Muhammad A. Alam, Joerg Appenzeller

    The school will consist of two lectures in the morning on the Nanostructured Electronic Devices: Percolation and Reliability and an afternoon lecture on Graphene Physics and Devices. A hands on laboratory session will be available in the afternoons.

  3. A Blind Fish in a River with a Waterfall

    23 Mar 2010 | | Contributor(s):: Muhammad Alam, Sajia Sadeque

    Prototype for a reliability problem defined as Stochastic Process with a Threshold

  4. A Physical Model for Non-Ohmic Shunt Conduction and Metastability in Amorphous Silicon Solar Cells

    15 Aug 2011 | | Contributor(s):: Sourabh Dongaonkar, Souvik Mahapatra, Karthik Yogendra, Muhammad Alam

    In this talk we develop a coherent physics based understanding of the shunt leakage problem in a-Si:H cells, and discuss its implications on cell and module level.Sourabh Dongaonkar is with School of Electrical and Computer Engineering, Purdue University, West Lafayette, INKarthik Y and Souvik...

  5. Ali Aldubaisi

    https://nanohub.org/members/88716

  6. Andrew L. Sternberg

    Andrew Sternberg received his B.S in Engineering Science from Lipscomb University in 1999, and a M.S and Ph.D. in Electrical Engineering from Vanderbilt University in 2003 and 2006 respectively. He...

    https://nanohub.org/members/430191

  7. Big Data in Reliability and Security: Applications

    29 May 2019 | | Contributor(s):: Saurabh Bagchi

  8. Big Data in Reliability and Security: Some Basics

    29 May 2019 | | Contributor(s):: Saurabh Bagchi

  9. Birck Science Communication Shark Tank Compititon 2018

    10 Dec 2018 |

    The Science Communication Shark Tank competition and workshop gives students a chance to learn and train master storyteller skills in the best possible way: by playing a real-life game.

  10. E3S Theme II: Nanomechanics eBook

    22 Feb 2020 | | Contributor(s):: Center for Energy Efficient Electronics Science (editor), Tsu-Jae King Liu, Farnaz Niroui, Edgar Acosta, Sergio Fabian Almeida, Vladimir Bulovic, Sara Fathipour, Jinchi Han, Jeffrey H. Lang, Mariana Martinez, Jose Mireles, Rawan Naous, Benjamin Osoba, Jatin Patil, Bivas Saha, Mayuran Saravanapavanantham, Urmita Sikder, Vladimir Stojanovic, Timothy Swager, Aldo Vidana, Junqiao Wu, Alice Ye, David Zubia

    This eBook was written by faculty, postdoctoral researchers, students, and staff of the Center for Energy Efficient Electronics Science (E3S). The Center is a consortium of five world-class academic institutions: University of California at Berkeley, Massachusetts Institute of Technology,...

  11. ECE 606 Lecture 39: Reliability of MOSFET

    28 Apr 2009 | | Contributor(s):: Muhammad A. Alam

  12. ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET

    14 Nov 2008 | | Contributor(s):: Muhammad A. Alam

    Guest lecturer: Muhammad A. Alam.

  13. ECE 695A Lecture 10: NBTI Time Dependence -- Frequency and Duty Cycle Dependencies

    06 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:NBTI stress and relaxation by R-D modelFrequency independence and lifetime projectionDuty cycle dependenceThe magic of measurementConclusions

  14. ECE 695A Lecture 10A: Appendix - Reflection on R-D Equation

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

  15. ECE 695A Lecture 11: Temperature Dependence of NBTI

    07 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Review: Temperature activation & NBTITemperature dependent forward/reverse ratesTemperature dependence of diffusion coefficientMaterial dependence of activation energyConclusion

  16. ECE 695A Lecture 11R: Review Questions

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Does Einstein relationship hold for activated diffusion?People argue that the forward dissociation and reverse passivation have similar activation barriers. Would you support the argument?What assumption did I make regarding diffusion of H in SiO2 that makes the derivation...

  17. ECE 695A Lecture 12: Field Dependence of NBTI

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Background: Field dependent degradationComponents of field-dependent dissociation:Interpreting experimentsVoltage acceleration factorsConclusion

  18. ECE 695A Lecture 12R: Review Questions

    08 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Explain the difference between local field and global field within an oxide. Explain physically why electric field decreases bond strength.How does the dissociation process becomes non-Arrhenius?Do you think the diffusion and repassivation will also become non-Arrhenius when...

  19. ECE 695A Lecture 13: Introductory Lecture on HCI Degradation

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Outline:Background and features of HCI DegradationPhenomenological observationsOrigin of Hot carriersTheory of Si-H Bond DissociationTheory of Si-O Bond DissociationConclusions

  20. ECE 695A Lecture 13R: Review Questions

    19 Feb 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:Both SiH and SiO are involved in HCI degradation. Give two evidences.Why doesn’t HCI occur during NBTI stress condition?I suggested that HCI curve can shifted horizontally to form a universal curve, do you believe that I can do a corresponding vertical shift to form the universal...