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Tags: Reliability physics

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  1. Time-dependent gate oxide breakdown Lab

    04 Mar 2014 | Tools | Contributor(s): Xin Jin, Muhammad Ashraful Alam, Muhammad Masuduzzaman, Sang Hoon Shin, Sambit Palit

    Simulate Time-dependent gate oxide breakdown

    http://nanohub.org/resources/tddb

  2. Husnain Al Bustam

    I am Husnain Al Bustam, graduate student in the department of Electrical and Computer Engineering, Purdue University-Calumet. I completed my Bachelor of Science in Electrical and Electronic...

    http://nanohub.org/members/89070

  3. Ankush Chaudhary

    http://nanohub.org/members/70196

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.