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Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Contributor(s):: Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
AFM imaging of bare silicon surface to measure its rms roughness
Open | Responses: 1
my question is related to AFM imaging of silicon surface.
after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....