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Tags: roughness measurement

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  1. AFM imaging of bare silicon surface to measure its rms roughness

    Open | Responses: 1

    Dear Friends,

    my question is related to AFM imaging of silicon surface. after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....

    http://nanohub.org/answers/question/242

  2. Corrosion Mechanisms in Magnetic Recording Media

    29 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk

    This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.

    http://nanohub.org/resources/19028

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