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AFM imaging of bare silicon surface to measure its rms roughness
Open | Responses: 1
my question is related to AFM imaging of silicon surface.
after doing phase (AC mode) imaging of silicon surface. i found the roughness of bare silicon surface is ~ 50 nm....
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Presentation Materials | Contributor(s): Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.