Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.
Atomic Force Microscope Investigations of Lubrication Layers
Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›
26 Nov 2012 | Notes | Contributor(s): Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
Haptic Interfaces to Scanning Probe Microscopy
21 Apr 2004 | Notes | Contributor(s): Daniel Wilhelm
2003 SURI Conference Proceedings
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | Notes | Contributor(s): Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant …
nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.