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Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.
Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.
Corrosion Mechanisms in Magnetic Recording Media
29 Jul 2013 | Contributor(s):: Brian Demczyk
This presentation describes the corrosion process in longitudinal and perpendicular recording media, based upon electron and scanning probe microscopic analysis.
Atomic Force Microscope Investigations of Lubrication Layers
26 Nov 2012 | | Contributor(s):: Brian Demczyk
This presentation discusses the characterization of hard disk lubrication layers by phase contrast atomic force microscopy.
Nanoscale Dimensions in Hard Disk Media
27 Sep 2012 | | Contributor(s):: Brian Demczyk
This presentation examines the relationship of longidudinal hard disk media nanostructure,lubricant distribution and surface nanoroughness to disk contact to flying time transition and lubricant thickness to data zone takeoff. Also included is a model of disk wear.
Haptic Interfaces to Scanning Probe Microscopy
out of 5 stars
21 Apr 2004 | | Contributor(s):: Daniel Wilhelm
2003 SURI Conference Proceedings