Support

Support Options

Submit a Support Ticket

 
You are here: Home › Tags › scanning probe microscopy › Resources

Tags: scanning probe microscopy

Description

Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position.

Learn more about quantum dots from the many resources on this site, listed below. More information on Scanning probe microscopy can be found here.

Resources (1-20 of 30) feed

  1. Chemically Enhanced Carbon-Based Nanomaterials and Devices

    This resource has a 5.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 142
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    09 Nov 2010 | Online Presentations | Contributor(s): Mark Hersam

    Carbon-based nanomaterials have attracted significant attention due to their potential to enable and/or improve applications such as transistors, transparent conductors, solar cells, batteries, and …

    http://nanohub.org/resources/9929

  2. ECET 499N Lecture 12: Scanning Probe Microscopy Applications (in Neuroscience and Beyond)

    This resource has a 6.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 304
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    12 Apr 2010 | Online Presentations | Contributor(s): Helen McNally

    http://nanohub.org/resources/8837

  3. ECET 499N Lecture 7: Scanning Probe Microscopy II

    This resource has a 6.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 402
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    08 Mar 2010 | Online Presentations | Contributor(s): Helen McNally

    http://nanohub.org/resources/8585

  4. ECET 499N Lecture 6: Scanning Probe Microscopy I

    This resource has a 6.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 464
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    19 Feb 2010 | Online Presentations | Contributor(s): Helen McNally

    http://nanohub.org/resources/8523

  5. ME 597 Lecture 26: Scanning Probe Nanolithography

    This resource has a 6.7 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 381
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    02 Dec 2009 | Online Presentations | Contributor(s): Ron Reifenberger

    Topics: STM – early work Arranging atoms with a tip Local Oxidation Lithography (Electrochemical) Dip Pen Lithography Nanografting Related reading: Garcia, Martinez and Martinez, …

    http://nanohub.org/resources/7933

  6. Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications

    This resource has a 6.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 297
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    21 Sep 2009 | Online Presentations | Contributor(s): andrei kolmakov

    Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with …

    http://nanohub.org/resources/5738

  7. ECET 499N: Introduction to Nanotechnology

    This resource has a 6.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 4298
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    30 Mar 2009 | Courses | Contributor(s): Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …

    http://nanohub.org/resources/6583

  8. So What do Biologist, Biotechnologists & Pharmaceutical Scientist Want With an AFM/SPM Anyway?

    This resource has a 5.2 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 60
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    11 Sep 2008 | Online Presentations | Contributor(s): Kunal Bose

    http://nanohub.org/resources/4818

  9. BNC Research Review: Carbon Nanotubes as Nucleic Acid Carriers

    This resource has a 8.6 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 602
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    04 Jun 2008 | Online Presentations | Contributor(s): Don Bergstrom

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming …

    http://nanohub.org/resources/4712

  10. SPMW Scanning Impedance Microscopy: probing local electronic structure and transport anomalies

    This resource has a 6.2 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 184
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    05 Jan 2007 | Online Presentations | Contributor(s): dawn bonnell

    Multiple modulation SPM is a general term for a strategy that extracts information about a surface or nanostructure by combining various signals on samples and tips, using multiple frequencies to …

    http://nanohub.org/resources/2198

  11. SPMW A fresh look to amplitude-modulation AFM: Force minimization, interaction measurement, and the quest for high resolution

    This resource has a 7.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 466
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    05 Jan 2007 | Online Presentations | Contributor(s): Udo Schwarz

    Frequency modulation atomic force microscopy (FM-AFM) has been able to deliver high-resolution atomic-scale images in ultrahigh vacuum for over one decade. In addition, there have been recent reports …

    http://nanohub.org/resources/2208

  12. Orbital Mediated Tunneling in a New Unimolecular Rectifier

    This resource has a 6.3 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 235
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    25 May 2007 | Online Presentations | Contributor(s): Robert Metzger, NCN at Northwestern University

    In 1997 we showed that hexadecylquinolinium tricyanoquinodimethanide is a unimolecular rectifier, by scanning tunneling microscopy and also as a Langmuir-Blodgett (LB) monolayer, sandwiched between …

    http://nanohub.org/resources/2748

  13. SPMW AFM at Video Rate and Beyond

    This resource has a 6.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 497
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    16 May 2007 | Online Presentations | Contributor(s): Mervyn Miles

    The particular advantages that atomic force microscopy (AFM) has over other types of microscopy are well-known, but it has the one major disadvantage of low imaging rates in conventional instruments …

    http://nanohub.org/resources/2723

  14. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    This resource has a 6.2 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 476
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    10 May 2007 | Online Presentations | Contributor(s): Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming …

    http://nanohub.org/resources/2635

  15. MSE 376 Lecture 11: SPM Lithography, part 3

    This resource has a 8.4 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 853
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    26 Mar 2007 | Online Presentations | Contributor(s): Mark Hersam

    http://nanohub.org/resources/2519

  16. MSE 376 Lecture 10: SPM Lithography, part 2

    This resource has a 9.1 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 953
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    26 Mar 2007 | Online Presentations | Contributor(s): Mark Hersam

    http://nanohub.org/resources/2518

  17. MSE 376 Lecture 9: SPM Lithography, part 1

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 2238
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    26 Mar 2007 | Online Presentations | Contributor(s): Mark Hersam

    http://nanohub.org/resources/2517

  18. Frontiers in Scanning Probe Microscopy

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 6466
    Reviews & Citations
    Google/IEEE
    Avg. Review: 0.0 out of 5 stars
    Citations:

    30 Nov 2006 | Workshops

    From October 4- 6, 2006 the Birck Nanotechnology Center at Purdue University hosted a three day focused workshop on cutting edge SPM techniques that are under development throughout the world. …

    http://nanohub.org/resources/2035

  19. A Primer on Scanning Tunneling Microscopy (STM)

    This resource has a 10.0 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Dec, 2011
    Users: 3831
    Reviews & Citations
    Google/IEEE
    Avg. Review: 5.0 out of 5 stars
    Citations:

    04 Apr 2006 | Online Presentations | Contributor(s): Ron Reifenberger

    Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the …

    http://nanohub.org/resources/1185

  20. Scanning Probe Microscope Piezoelectric Crystals

    This resource has a 6.8 Ranking

    Ranking is calculated from a formula comprised of user reviews and usage data. Learn more ›

    Usage Stats
    Total: updated 01 Jan, 2010
    Users: 75
    Reviews & Citations
    Google/IEEE
    Avg. Review: 5.0 out of 5 stars
    Citations:

    16 Nov 2005 | Animations | Contributor(s): John C. Bean

    In this resource we disassemble the piezoelectric assembly of a scanning probe microscope. At its core is a white cylinder of the piezoelectric material. If you look closely, it has a granular …

    http://nanohub.org/resources/444

  • Results 1 - 20 of 30
  • Start
  • 1
  • 2
  • End

Get Help

Get Involved

Legal

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies.