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Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
Nanotechnology for Aerospace Research: Surface Science Applications
29 Mar 2016 | | Contributor(s):: Dmitry Zemlyanov
Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...
[Illinois] AVS Meeting 2012: Adsorption and Desorption of Hydrogen on Epitaxial Graphene on SiC(0001): An Ultra-High Vacuum STM Study
04 Jun 2013 | | Contributor(s):: TeYu Chien
With superlative physical, chemical, and electronic properties, graphene shows significant promise in a variety of technologies, including transistors, sensors, and energy conversion/storage devices.However, as an atomically thin material, graphene is highly sensitive to its environment, which...
ME 597 Lecture 4: The Transition from STM to AFM
09 Sep 2010 | | Contributor(s):: Ron Reifenberger
Recommended Reading: See References below.
ME 597 Lecture 3: Advanced Topics in STM
Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals
ME 597 Lecture 2: STM Experimental Considerations
01 Sep 2010 | | Contributor(s):: Ron Reifenberger
Topics:Early SuccessesHow to Make an STMRecommended Reading: See References below.
ME 597 Lecture 1: Review of Quantum Tunneling/Introduction to STM
Topics:Quantum TunnelingThe STM – basic ideaRecommended Reading: See References below.
ME 597 Lecture 6: The Transition from STM to AFM
26 Oct 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 5: Some Topics in STM
20 Oct 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 4: How to Make an STM
13 Oct 2009 | | Contributor(s):: Ron Reifenberger
Topics:Early SuccessesHow to Make an STM
ME 597 Lecture 3: Quantum Tunneling/The STM
08 Oct 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 2: Electron States in Solids-Density of States
09 Sep 2009 | | Contributor(s):: Ron Reifenberger
Note: This lecture has been revised since its original presentation.Topics:Electron States in Solids – Bloch FunctionsKronig-Penney ModelDensity of States
Nanotribology, Nanomechanics and Materials Characterization Studies
08 Jun 2009 | | Contributor(s):: Bharat Bhushan
Fundamental nanotribological studies provide insight to molecular origins of interfacial phenomena including adhesion, friction, wear and lubrication. Friction and wear of lightly loaded micro/nano components are highly dependent on the surface interactions (few atomic layers). Nanotribological...
Carbon Nanotechnology: Scientific and Technological Issues
out of 5 stars
24 Feb 2008 | | Contributor(s):: Joe Lyding
Carbon nanotechnologies based on single-walled carbon nanotubes (SWNTs) and graphene (a single atomic layer of graphite) are being pursued for a wide range of technological applications ranging from chemical sensing to post-silicon nanoelectronics. A common thread is the need to atomistically...
Electrons in Two Dimensions: Quantum Corrals and Semiconductor Microstructures
04 Dec 2007 | | Contributor(s):: Eric J. Heller
The images generated by a scanning tunneling microscope are iconic. Some of the most famous are Don Eigler’s quantum corrals, which reveal not only the guest atoms on a surface but especially the interference patterns of electrons shuttling back and forth along the surface. To understand the...
Selective Silicon Epitaxy Seen at the Nanometer Scale
14 Jun 2007 | | Contributor(s):: Matthew Mark Sztelle
The presenter introduces NEMS (nanoelectromechanical systems) and STM (Scanning Tunneling Microscopy and continues to present material on Selective Silicon Epitaxy seen at the Nanometer ScaleMatthew M. Sztelle is a Research Assistant in the Scanning Tunneling Microscopy Group at the Beckman...
A Primer on Scanning Tunneling Microscopy (STM)
04 Apr 2006 | | Contributor(s):: Ron Reifenberger
Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the world-wide emergence of Nanotechnology. In this talk, the fundamental ideas behind the first scanning...
Probing Silicon-Based Molecular Electronics with Scanning Tunneling Microscopy
29 Jul 2005 |
In recent years, substantial progress has occurred in the field of molecular electronics . In this paper, charge transport through molecule-semiconductor junctions is probed with ultra-high vacuum (UHV) scanning tunneling microscopy (STM). The presence of the semiconductor band gap enables...
Probing Molecular Conduction with Scanning Probe Microscopy
08 Jul 2004 |
This tutorial will provide an overview of scanning probe microscopy (SPM) andits application towards problems in molecular conduction. In an effort to communicatethe power and limitations of these instruments, the tutorial will describe designconsiderations and reveal the detailed construction...