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A Primer on Scanning Tunneling Microscopy (STM)
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04 Apr 2006 | | Contributor(s):: Ron Reifenberger
Scanning Probe Microscopes and their remarkable ability to provide three-dimensional maps of surfaces at the nanometer length scale have arguably been the most important tool in establishing the world-wide emergence of Nanotechnology. In this talk, the fundamental ideas behind the first scanning...
Carbon Nanotechnology: Scientific and Technological Issues
24 Feb 2008 | | Contributor(s):: Joe Lyding
Carbon nanotechnologies based on single-walled carbon nanotubes (SWNTs) and graphene (a single atomic layer of graphite) are being pursued for a wide range of technological applications ranging from chemical sensing to post-silicon nanoelectronics. A common thread is the need to atomistically...
Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
Electrons in Two Dimensions: Quantum Corrals and Semiconductor Microstructures
04 Dec 2007 | | Contributor(s):: Eric J. Heller
The images generated by a scanning tunneling microscope are iconic. Some of the most famous are Don Eigler’s quantum corrals, which reveal not only the guest atoms on a surface but especially the interference patterns of electrons shuttling back and forth along the surface. To understand the...
First Principles Non-Equilibrium Green's Function Modeling of Vacum and Oxide Barrier Tunneling
01 Dec 2008 | | Contributor(s):: Kirk H. Bevan
Vacuum and oxide barrier electron tunneling phenomena have been studied at length for several decades. Yet with electron device barrier widths now commonly measured in atomic units, complex quantum mechanical phenomena such as wavefunction coupling, surface states, and interface bonds have begun...
Introduction to Scanning Tunneling Microscopy
20 Apr 2007 | | Contributor(s):: Hyung-Seok Hahm
This is a 60 second movie clip with an introduction to Scanning Tunneling Microscopy(STM). Design goals are - Give an idea of what STM looks like- Provide an overview of what STM does and how it worksProduced by Imran Sobh and Hyung-Seok HahmAs part of instructional materials by National Center...
ME 597 Lecture 1: Review of Quantum Tunneling/Introduction to STM
31 Aug 2010 | | Contributor(s):: Ron Reifenberger
Topics:Quantum TunnelingThe STM – basic ideaRecommended Reading: See References below.
ME 597 Lecture 2: Electron States in Solids-Density of States
09 Sep 2009 | | Contributor(s):: Ron Reifenberger
Note: This lecture has been revised since its original presentation.Topics:Electron States in Solids – Bloch FunctionsKronig-Penney ModelDensity of States
ME 597 Lecture 2: STM Experimental Considerations
Topics:Early SuccessesHow to Make an STMRecommended Reading: See References below.
ME 597 Lecture 3: Advanced Topics in STM
Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals
ME 597 Lecture 3: Quantum Tunneling/The STM
08 Oct 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 4: How to Make an STM
13 Oct 2009 | | Contributor(s):: Ron Reifenberger
Topics:Early SuccessesHow to Make an STM
ME 597 Lecture 4: The Transition from STM to AFM
09 Sep 2010 | | Contributor(s):: Ron Reifenberger
Recommended Reading: See References below.
ME 597 Lecture 5: Some Topics in STM
20 Oct 2009 | | Contributor(s):: Ron Reifenberger
ME 597 Lecture 6: The Transition from STM to AFM
26 Oct 2009 | | Contributor(s):: Ron Reifenberger
ME 597/PHYS 570: Fundamentals of Atomic Force Microscopy (Fall 2009)
01 Sep 2009 | | Contributor(s):: Ron Reifenberger, Arvind Raman
A course for students interested in learning the fundamentals underlying Atomic Force Microscopy.