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Tunneling Into Emergent Topological Matter
14 Jan 2021 | | Contributor(s):: Jia-Xin Yin
n this talk, I will discuss the proof-of-principle methodology applied to study the quantum topology in this discipline, with particular attention to studies performed under a tunable vector magnetic field, which is a relatively new direction of recent focus...
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Jia-Xin Yin
Dr. Jia-xin Yin is currently a Postdoctorial Researcher in Prof. Zahid Hasan's team in Princeton University, USA, and focuses on the scanning tunneling microscopy of emergent topological matter,...
https://nanohub.org/members/312790
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David Daughton
Dr. David Daughton is a Lake Shore Application Scientist focused on characterizing electronic materials and devices. He received his BS and MS in Physics from the University of Delaware and his PhD...
https://nanohub.org/members/279596
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Advanced Scanning Probe Microscopy I
01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network
OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation
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The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale
20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network
OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves
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Characterization of 2D materials at Birck Surface Analysis Facility
28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov
Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...
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Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
Blog
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19 May 2016 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...
https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in
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Nanotechnology for Aerospace Research: Surface Science Applications
29 Mar 2016 | | Contributor(s):: Dmitry Zemlyanov
Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...
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Research Article: STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite
Blog
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24 Dec 2015 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Applied Surface Science, vol. 360, part B, pp. 451-460, 2016 (DOI:...
https://nanohub.org/members/112015/blog/2015/12/stm-observation-of-a-box-shaped-graphene-nanostructure-appeared-after-mechanical-cleavage-of
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Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
Blog
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04 Dec 2015 |
Posted by Rostislav Vladimirovich Lapshin
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...
https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach
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Kathy Walsh
https://nanohub.org/members/119508
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Rostislav Vladimirovich Lapshin
see www.lapshin.fast-page.org/biography.htm
https://nanohub.org/members/112015
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Rostislav Vladimirovich Lapshin
Term: January 1996 – presentEmployer: Institute of Physical Problems named after F. V. LukinDepartment: NanoelectronicsLaboratory: Solid NanotechnologyAddress: passage 4806,...
https://nanohub.org/members/105488
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Toai Quang Le
https://nanohub.org/members/85714
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[Illinois] AVS Meeting 2012: Adsorption and Desorption of Hydrogen on Epitaxial Graphene on SiC(0001): An Ultra-High Vacuum STM Study
04 Jun 2013 | | Contributor(s):: TeYu Chien
With superlative physical, chemical, and electronic properties, graphene shows significant promise in a variety of technologies, including transistors, sensors, and energy conversion/storage devices.However, as an atomically thin material, graphene is highly sensitive to its environment, which...
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Amin Vakhshouri
I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research involved...
https://nanohub.org/members/73806
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Alok Ranjan
https://nanohub.org/members/71877
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Christian Emanuelsson
https://nanohub.org/members/63662
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ME 597 Lecture 4: The Transition from STM to AFM
09 Sep 2010 | | Contributor(s):: Ron Reifenberger
Recommended Reading: See References below.
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ME 597 Lecture 3: Advanced Topics in STM
09 Sep 2010 | | Contributor(s):: Ron Reifenberger
Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals