Tags: scanning tunneling microscopy (STM)

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  1. Tunneling Into Emergent Topological Matter

    14 Jan 2021 | | Contributor(s):: Jia-Xin Yin

    n this talk, I will discuss the proof-of-principle methodology applied to study the quantum topology in this discipline, with particular attention to studies performed under a tunable vector magnetic field, which is a relatively new direction of recent focus...

  2. Jia-Xin Yin

    Dr. Jia-xin Yin is currently a Postdoctorial Researcher in Prof. Zahid Hasan's team in Princeton University, USA, and focuses on the scanning tunneling microscopy of emergent topological matter,...

    https://nanohub.org/members/312790

  3. David Daughton

    Dr. David Daughton is a Lake Shore Application Scientist focused on characterizing electronic materials and devices. He received his BS and MS in Physics from the University of Delaware and his PhD...

    https://nanohub.org/members/279596

  4. Advanced Scanning Probe Microscopy I

    01 Oct 2018 | | Contributor(s):: Sebastien Maeder, NACK Network

    OutlinePart 1: This LectureOverview of Scanning Probe TechniquesScanning Tunneling MicroscopyAtomic Force MicroscopyHardware and ComponentsTip/Sample InteractionsPart 2: Can be viewed hereCommon Modes of OperationPitfalls and Image ArtifactsExample of Instrument Operation

  5. The Use of Probes, Beams, and Waves for Characterization at the Nano-Scale

    20 Jul 2018 | | Contributor(s):: Stephen J. Fonash, NACK Network

    OutlineThe tools for characterizing materials and structures at the nano-scaleProbesPhoton beamsElectron beamsIon beamsAcoustic waves

  6. Characterization of 2D materials at Birck Surface Analysis Facility

    28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov

    Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

  7. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

    Blog | 19 May 2016 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2016/05/research-article-drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in

  8. Nanotechnology for Aerospace Research: Surface Science Applications

    29 Mar 2016 | | Contributor(s):: Dmitry Zemlyanov

    Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...

  9. Research Article: STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite

    Blog | 24 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Applied Surface Science, vol. 360, part B, pp. 451-460, 2016 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/stm-observation-of-a-box-shaped-graphene-nanostructure-appeared-after-mechanical-cleavage-of

  10. Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

    Blog | 04 Dec 2015 | Posted by Rostislav Vladimirovich Lapshin

    R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI:...

    https://nanohub.org/members/112015/blog/2015/12/drift-insensitive-distributed-calibration-of-probe-microscope-scanner-in-nanometer-range-approach

  11. Kathy Walsh

    https://nanohub.org/members/119508

  12. Rostislav Vladimirovich Lapshin

    see www.lapshin.fast-page.org/biography.htm 

    https://nanohub.org/members/112015

  13. Rostislav Vladimirovich Lapshin

    Term: January 1996 – presentEmployer: Institute of Physical Problems named after F. V. LukinDepartment: NanoelectronicsLaboratory: Solid NanotechnologyAddress: passage 4806,...

    https://nanohub.org/members/105488

  14. Toai Quang Le

    https://nanohub.org/members/85714

  15. [Illinois] AVS Meeting 2012: Adsorption and Desorption of Hydrogen on Epitaxial Graphene on SiC(0001): An Ultra-High Vacuum STM Study

    04 Jun 2013 | | Contributor(s):: TeYu Chien

    With superlative physical, chemical, and electronic properties, graphene shows significant promise in a variety of technologies, including transistors, sensors, and energy conversion/storage devices.However, as an atomically thin material, graphene is highly sensitive to its environment, which...

  16. Amin Vakhshouri

    I am a solid-state physicist, specialized in design, fabrication and electronic characterization of advanced materials using transport and scanning probe microscopy techniques. My research involved...

    https://nanohub.org/members/73806

  17. Alok Ranjan

    https://nanohub.org/members/71877

  18. Christian Emanuelsson

    https://nanohub.org/members/63662

  19. ME 597 Lecture 4: The Transition from STM to AFM

    09 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Recommended Reading: See References below.

  20. ME 597 Lecture 3: Advanced Topics in STM

    09 Sep 2010 | | Contributor(s):: Ron Reifenberger

    Topics:Scanning Tunneling Spectroscopy (STS)Current Imaging Tunneling Spectroscopy (CITS)Apparent barrier heightForce on the tipAtomic CorrugationQuantum Corrals