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Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
16 Feb 2010 | | Contributor(s):: Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...
Transformative Power Semiconductor Technologies to Impact 21st Century Energy Economy, and Space and Defense Electronics
22 Sep 2010 | | Contributor(s):: Krishna Shenai
This talk will focus on advanced power semiconductor materials, devices, circuits and systems that are needed in order to address this daunting challenge. Specifically we will discuss emerging silicon and wide bandgap materials and power devices, heterogeneous chip-scale power integration,...