Tags: simulator

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  1. Semiconductor Device Simulator

    Closed | Responses: 0

    Can I use Silvaco instead of Medici or Sentaurus for OPV structure? I have already tried to download Sentaurus device simulator but it is not available for Bangladesh.

    http://nanohub.org/answers/question/1204

  2. BTI Simulator for Gate-sided Hydrogen release (Dispersive-Reaction) Model

    17 Oct 2016 | Downloads | Contributor(s): Narendra Parihar, Rakesh P Rao, Souvik Mahapatra

    This simulator calculates the kinetics associated with hydrogen release from the Gate during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si p-MOSFETs. The...

    http://nanohub.org/resources/24943

  3. BTI Simulator for Multi-State Model

    26 Sep 2016 | Downloads | Contributor(s): Rakesh P Rao, Narendra Parihar, Sujay Desai, Souvik Mahapatra

    This simulator calculates the kinetics associated with hole trapping in pre-existing gate insulator traps during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si...

    http://nanohub.org/resources/24942

  4. BTI Simulator for Triple-Well Model

    27 Oct 2016 | Downloads | Contributor(s): Narendra Parihar, Rakesh P Rao, Sujay Desai, Souvik Mahapatra

    This simulator calculates the kinetics associated with trap generation during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si p-MOSFETs. The calculations are...

    http://nanohub.org/resources/24944

  5. BTI Simulator for Two Well Multiphonon Model

    06 Sep 2016 | Downloads | Contributor(s): Rakesh P Rao, Narendra Parihar, Sujay Desai, Souvik Mahapatra

    This simulator calculates the kinetics associated with hole trapping in pre-existing gate insulator traps during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si...

    http://nanohub.org/resources/24893

  6. BTI Simulator for Two Well Thermionic Model

    29 Aug 2016 | Downloads | Contributor(s): Rakesh P Rao, Narendra Parihar, Sujay Desai, Souvik Mahapatra

    This simulator calculates the kinetics associated with hole trapping in pre-existing gate insulator traps during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si...

    http://nanohub.org/resources/24873