Tags: surface roughness scattering

Resources (1-2 of 2)

  1. Device Physics and Simulation of Silicon Nanowire Transistors

    28 Jun 2013 | | Contributor(s):: Jing Wang

    As the conventional silicon metal-oxide-semiconductor field-effect transistor (MOSFET) approaches its scaling limits, many novel device structures are being extensively explored. Among them, the silicon nanowire transistor (SNWT) has attracted broad attention from both the semiconductor industry...

  2. Texture-Induced hcp c-axis Alignment in Longitudinal Media

    15 Jul 2013 | | Contributor(s):: Brian Demczyk

    This presentation discusses the development and measurement of c-axis text in longitudinal hard disk media.