Tags: surface science

Resources (1-7 of 7)

  1. CHM 696 Lecture 8: Self-Assembled Monolayers/Supramolecular Surface Science I

    25 Apr 2011 | | Contributor(s):: Alexander Wei

  2. CHM 696 Lecture 9: Self-Assembled Monolayers/Supramolecular Surface Science II

    10 Mar 2011 | | Contributor(s):: Alexander Wei

  3. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  4. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  5. Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

    07 Oct 2011 | | Contributor(s):: Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner

    We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.

  6. Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG

    16 Feb 2010 | | Contributor(s):: Dmitry Zemlyanov

    In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...

  7. XPS Thickness Solver

    18 Dec 2011 | | Contributor(s):: Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin

    Helps the user to determine the thickness of an overlayer material from XPS experiment data.