XPS Thickness Solver

18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin

Helps the user to determine the thickness of an overlayer material from XPS experiment data.

https://nanohub.org/resources/12697

Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films

07 Oct 2011 | Publications | Contributor(s): Brian Demczyk

We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on hydrogen-terminated @100# silicon substrates. Coauthors: V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner

https://nanohub.org/resources/12237

CHM 696 Lecture 8: Self-Assembled Monolayers/Supramolecular Surface Science I

07 Mar 2011 | Online Presentations | Contributor(s): Alexander Wei

https://nanohub.org/resources/10950

CHM 696 Lecture 9: Self-Assembled Monolayers/Supramolecular Surface Science II

07 Mar 2011 | Online Presentations | Contributor(s): Alexander Wei

https://nanohub.org/resources/10951

ECET 499N Lecture 8: Electron Microscopy

02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach

Guest lecture: Eric A. Stach

https://nanohub.org/resources/8587

Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG

30 Jan 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov

In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of …

https://nanohub.org/resources/8312

ECET 499N: Introduction to Nanotechnology

30 Mar 2009 | Courses | Contributor(s): Helen McNally

An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …

https://nanohub.org/resources/6583