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XPS Thickness Solver
18 Dec 2011 | | Contributor(s):: Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
07 Oct 2011 | | Contributor(s):: Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.
CHM 696 Lecture 8: Self-Assembled Monolayers/Supramolecular Surface Science I
07 Mar 2011 | | Contributor(s):: Alexander Wei
CHM 696 Lecture 9: Self-Assembled Monolayers/Supramolecular Surface Science II
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
30 Jan 2010 | | Contributor(s):: Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...