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XPS Thickness Solver
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18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin
Helps the user to determine the thickness of an overlayer material from XPS experiment data.
Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
07 Oct 2011 | Publications | Contributor(s): Brian Demczyk
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy on hydrogen-terminated @100# silicon substrates. Coauthors: V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
CHM 696 Lecture 8: Self-Assembled Monolayers/Supramolecular Surface Science I
07 Mar 2011 | Online Presentations | Contributor(s): Alexander Wei
CHM 696 Lecture 9: Self-Assembled Monolayers/Supramolecular Surface Science II
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach
Guest lecture: Eric A. Stach
Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG
30 Jan 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov
In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of …
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …
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