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Tags: TDDB

All Categories (1-6 of 6)

  1. Time-dependent gate oxide breakdown Lab

    04 Mar 2014 | Tools | Contributor(s): Xin Jin, Muhammad Ashraful Alam, Muhammad Masuduzzaman, Sang Hoon Shin, Sambit Palit

    Simulate Time-dependent gate oxide breakdown


  2. Introduction to Reliability

    Generalized Reliability Model A Blind Fish in a River with a Waterfall Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...


  3. ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model

    21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Outline: Observations: Failure times are statistically distributed Models of Failure Distribution: Extrinsic vs. percolation Percolation theory of multiple Breakdown TDDB lifetime...


  4. ECE 695A Lecture 22R: Review Questions

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam


  5. ECE 695A Lecture 23: Characterization of Defects Responsible for TDDB

    19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam


  6. ECE 695A Lecture 21R: Review Questions

    12 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam

    Review Questions: What is the name of the failure distribution that we expect for thin oxides? For thin oxides, is PMOS or NMOS more of a concern in modern transistors? What is DBIE? When...


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