Tags: TDDB

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  1. Time-dependent gate oxide breakdown Lab

    04 Mar 2014 | | Contributor(s):: Xin Jin, Muhammad Ashraful Alam, Muhammad Masuduzzaman, Sang Hoon Shin, Sambit Palit

    Simulate Time-dependent gate oxide breakdown

  2. Introduction to Reliability

    Generalized Reliability Model A Blind Fish in a River with a Waterfall Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...

    http://nanohub.org/wiki/IntroductiontoReliability

  3. ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model

    19 Mar 2013 | | Contributor(s):: Muhammad Alam

    Outline:Observations: Failure times are statistically distributedModels of Failure Distribution: Extrinsic vs. percolationPercolation theory of multiple BreakdownTDDB lifetime projectionConclusions

  4. ECE 695A Lecture 22R: Review Questions

    19 Mar 2013 | | Contributor(s):: Muhammad Alam

  5. ECE 695A Lecture 23: Characterization of Defects Responsible for TDDB

    19 Mar 2013 | | Contributor(s):: Muhammad Alam

  6. ECE 695A Lecture 21R: Review Questions

    08 Mar 2013 | | Contributor(s):: Muhammad Alam

    Review Questions:What is the name of the failure distribution that we expect for thin oxides?For thin oxides, is PMOS or NMOS more of a concern in modern transistors?What is DBIE? When does it occur? Can the transistor be still functional ?In what ways is TDDB compare with NBTI and HCI...