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Time-dependent gate oxide breakdown Lab
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04 Mar 2014 | Tools | Contributor(s): Xin Jin, Muhammad Ashraful Alam, Muhammad Masuduzzaman, Sang Hoon Shin, Sambit Palit
Simulate Time-dependent gate oxide breakdown
Introduction to Reliability
Generalized Reliability Model
A Blind Fish in a River with a Waterfall
Many reliability problems are activated by a threshold. If this threshold value is exceeded, some phenomenons are...
ECE 695A Lecture 24: Statistics of Oxide Breakdown - Cell percolation model
21 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Observations: Failure times are statistically distributed
Models of Failure Distribution: Extrinsic vs. percolation
Percolation theory of multiple Breakdown
ECE 695A Lecture 22R: Review Questions
19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 23: Characterization of Defects Responsible for TDDB
ECE 695A Lecture 21R: Review Questions
12 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
What is the name of the failure distribution that we expect for thin oxides?
For thin oxides, is PMOS or NMOS more of a concern in modern transistors?
What is DBIE? When...