Support

Support Options

Submit a Support Ticket

 

Tags: TEM

All Categories (1-20 of 64)

  1. QSTEM online

    01 Jul 2014 | Tools | Contributor(s): Mingxuan Lu, Chang Wan Han, Volkan Ortalan

    Quantitative TEM/STEM Simulations

    http://nanohub.org/resources/qstem

  2. Mahendra Ramajayam

    http://nanohub.org/members/86546

  3. Jun 06 2012

    Illinois AMC 2012 6th Advanced Materials Characterization Workshop

    This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will...

    http://nanohub.org/events/details/350

  4. Matt Schneider

    http://nanohub.org/members/66808

  5. Kevin Grossklaus

    I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion...

    http://nanohub.org/members/60848

  6. BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems

    22 Nov 2011 | Online Presentations | Contributor(s): James Leary

    See references below for related reading. 14.1      Introduction to integrated designs 14.1.1    “Total design” but there is some order in...

    http://nanohub.org/resources/12496

  7. TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

    20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto

    Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type...

    http://nanohub.org/resources/9912

  8. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach

    Guest lecture: Eric A. Stach

    http://nanohub.org/resources/8587

  9. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten

    http://nanohub.org/resources/8511

  10. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | Courses | Contributor(s): Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...

    http://nanohub.org/resources/6583

  11. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4641

  12. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4640

  13. MSE 640 Lecture 13: Diffraction contrast imaging

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

    http://nanohub.org/resources/4639

  14. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

    http://nanohub.org/resources/4637

  15. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

    http://nanohub.org/resources/4638

  16. MSE 640 Lecture 11: Diffraction contrast imaging

    29 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Thickness fringes, Bend contours, Planar faults

    http://nanohub.org/resources/4636

  17. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

    28 May 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4660

  18. MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

    28 May 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4655

  19. MSE 640 Lecture 18: X-ray production in the TEM

    28 May 2008 | Online Presentations | Contributor(s): Eric Stach

    http://nanohub.org/resources/4649

  20. MSE 640 Lecture 17: STEM Imaging

    27 May 2008 | Online Presentations | Contributor(s): Eric Stach

    Much of the material for this class is courtesy of Nigel Browning of UC Davis & LLNL and Dave Muller of Cornell.

    http://nanohub.org/resources/4644

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.