Tags: TEM

Online Presentations (1-20 of 28)

  1. BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems

    22 Nov 2011 | | Contributor(s):: James Leary

    See references below for related reading.14.1      Introduction to integrated designs14.1.1    “Total design” but there is some order in the design process14.1.2    A brief outline of the total design...

  2. ECET 499N Lecture 8: Electron Microscopy

    02 Mar 2010 | | Contributor(s):: Eric Stach

    Guest lecture: Eric A. Stach

  3. Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation

    18 Feb 2010 | | Contributor(s):: Klaus Schulten

  4. MSE 582 Lecture 10: Diffraction Contrast Imaging

    13 Feb 2008 | | Contributor(s):: Eric Stach

  5. MSE 582 Lecture 2: Basic Properties of Electrons and Electron Sources

    28 Jan 2008 | | Contributor(s):: Eric Stach

  6. MSE 582 Lecture 3: Lenses, Apertures and Resolution

    20 Sep 2017 | | Contributor(s):: Eric Stach

  7. MSE 582 Lecture 4: The Instrument, Part 1

    28 Jan 2008 | | Contributor(s):: Eric Stach

  8. MSE 582 Lecture 4: The Instrument, Part 2

    28 Jan 2008 | | Contributor(s):: Eric Stach

  9. MSE 582 Lecture 6: Vacuum Science in EM

    28 Jan 2008 | | Contributor(s):: Eric Stach

  10. MSE 582 Lecture 7: Sample Preperation

    11 Feb 2008 | | Contributor(s):: Eric Stach

  11. MSE 640 Lecture 11: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Thickness fringes, Bend contours, Planar faults

  12. MSE 640 Lecture 12: Diffraction contrast imaging, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  13. MSE 640 Lecture 12: Diffraction contrast imaging, Part 2

    29 May 2008 | | Contributor(s):: Eric Stach

    Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates

  14. MSE 640 Lecture 13: Diffraction contrast imaging

    29 May 2008 | | Contributor(s):: Eric Stach

    Weak beam dark field imaging, Simulation of diffraction contrast

  15. MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM

    29 May 2008 | | Contributor(s):: Eric Stach

  16. MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1

    29 May 2008 | | Contributor(s):: Eric Stach

  17. MSE 640 Lecture 17: STEM Imaging

    27 May 2008 | | Contributor(s):: Eric Stach

  18. MSE 640 Lecture 18: X-ray production in the TEM

    28 May 2008 | | Contributor(s):: Eric Stach

  19. MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM

    28 May 2008 | | Contributor(s):: Eric Stach

  20. MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)

    28 May 2008 | | Contributor(s):: Eric Stach