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MSE 582 Lecture 3: Lenses, Apertures and Resolution
out of 5 stars
20 Sep 2017 | | Contributor(s):: Eric Stach
01 Jul 2014 | | Contributor(s):: Mingxuan Lu, Chang Wan Han, Volkan Ortalan
Quantitative TEM/STEM Simulations
BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
10 Nov 2011 | | Contributor(s):: James Leary
See references below for related reading.14.1 Introduction to integrated designs14.1.1 “Total design” but there is some order in the design process14.1.2 A brief outline of the total design...
TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | | Contributor(s):: Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) , has been achieved using compositional gradient WC/C layer, or multilayered type [transition metal/transition carbide]n, [transition metal/transition nitride]n, [TiCN/ZrCN]n, among others....
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | | Contributor(s):: Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
17 Feb 2010 | | Contributor(s):: Klaus Schulten
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | | Contributor(s):: Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
29 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 11: Diffraction contrast imaging
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
28 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
MSE 640 Lecture 18: X-ray production in the TEM
MSE 640 Lecture 17: STEM Imaging
27 May 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 5,6,7: Review
17 Apr 2008 | | Contributor(s):: Eric Stach
MSE 640 Lecture 7: Dynamical effects in diffraction patterns
MSE 640 Lecture 5: Diffraction from Crystals "Structure Factor", Part 2
18 Mar 2008 | | Contributor(s):: Eric Stach