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Jun 06 2012
Illinois AMC 2012 6th Advanced Materials Characterization Workshop
This workshop provides a critical, comparative and condensed overview of mainstream analytical techniques for materials characterization with emphasis on practical applications. The workshop will …
I am a graduate research assistant at the University of Michigan- Ann Arbor, working in the Millunchick group. My research exams ion irradiation effects on III-V semiconductor film growth, ion beam …
BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
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22 Nov 2011 | Online Presentations | Contributor(s): James Leary
See references below for related reading. 14.1 Introduction to integrated designs 14.1.1 “Total design” but there is some order in the design process 14.1.2 A brief outline of …
TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) , has been achieved using compositional gradient WC/C layer, or multilayered type …
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical …
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 11: Diffraction contrast imaging
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
28 May 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
MSE 640 Lecture 18: X-ray production in the TEM
MSE 640 Lecture 17: STEM Imaging
27 May 2008 | Online Presentations | Contributor(s): Eric Stach
Much of the material for this class is courtesy of Nigel Browning of UC Davis & LLNL and Dave Muller of Cornell.
MSE 640 Lecture 5,6,7: Review
17 Apr 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 7: Dynamical effects in diffraction patterns
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