nanoHUB could be intermittently unavailable on 05/04 from 8:00 am – 1:00 pm (EST) for scheduled maintenance. All tool sessions will expire on 05/04 at 8:00 am (EST).
Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
0.0 out of 5 stars
01 Jul 2014 | Tools | Contributor(s): Mingxuan Lu, Chang Wan Han, Volkan Ortalan
Quantitative TEM/STEM Simulations
Jun 06 2012
Illinois AMC 2012 6th Advanced Materials Characterization Workshop
BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems
22 Nov 2011 | Online Presentations | Contributor(s): James Leary
See references below for related reading.
14.1 Introduction to integrated designs
14.1.1 “Total design” but there is some...
TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties
20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto
Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) , has been achieved using compositional gradient WC/C layer, or multilayered type...
ECET 499N Lecture 8: Electron Microscopy
02 Mar 2010 | Online Presentations | Contributor(s): Eric Stach
Guest lecture: Eric A. Stach
Illinois Phys550 Molecular Biophysics Lecture 8: Electron Microscopy, The Physical Foundation
18 Feb 2010 | Online Presentations | Contributor(s): Klaus Schulten
ECET 499N: Introduction to Nanotechnology
30 Mar 2009 | Courses | Contributor(s): Helen McNally
An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical...
MSE 640 Lecture 15: Theory of high resolutiion TEM, Part 1
29 May 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 14: Overview of Phase Contrast & High resolution TEM
MSE 640 Lecture 13: Diffraction contrast imaging
Weak beam dark field imaging, Simulation of diffraction contrast
MSE 640 Lecture 12: Diffraction contrast imaging, Part 1
Review: Planar faults, Strain fields -generally, Dislocations, Coherent precipitates
MSE 640 Lecture 12: Diffraction contrast imaging, Part 2
MSE 640 Lecture 11: Diffraction contrast imaging
Thickness fringes, Bend contours, Planar faults
MSE 640 Lecture 20: Electron Energy Loss Spectroscopy (EELS)
28 May 2008 | Online Presentations | Contributor(s): Eric Stach
MSE 640 Lecture 19: Energy Dispersive X-ray Analysis in the TEM
4.0 out of 5 stars
MSE 640 Lecture 18: X-ray production in the TEM
MSE 640 Lecture 17: STEM Imaging
27 May 2008 | Online Presentations | Contributor(s): Eric Stach
Much of the material for this class is courtesy of Nigel Browning of UC Davis & LLNL and Dave Muller of Cornell.