Mechanical Behavior of MEMS/NEMS
27 Feb 2014 | Contributor(s):: Yong Zhu
This lecture covers mechanical testing methods and behaviors of thin films and nanostructures. This lecture is related to the activities at the NSF Nanosystems Engineering Research Center (NERC) for Advanced Self-Powered Systems of Integrated Sensors and Technologies (ASSIST) at NC State University.
Structure and Morphology of Silicon Germanium Thin Films
30 Dec 2013 | Contributor(s):: Brian Demczyk
Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...
NEATEC K-12 Module - Thin Films Grades 6-8
10 Jan 2013 | | Contributor(s):: Brook Bourgeois, Jason Brechko, Cherilyn Dempsey, Nathan Ellis, Mary Ann Nickloy, NEATEC Developers
In this activity your students will have learned the correlation between color wavelengths and measurement. They will have effectively learned how to solve real-world and mathematical problems involving volume of spheres. Know the formulas for the volumes spheres and use them to solve real-world...
Evolution of microstructure and magnetic properties in magnetron-sputtered CoCr thin films
02 Feb 2012 | | Contributor(s):: Brian Demczyk
In this work, transmission electron microscopy, including the Lorentz mode is combined with magnetic measurements (vibrating sample magnetometry and ferromagnetic resonance)to draw correlations between the structural and magnetic constituents in cobalt-chromium films of increasing thickness.
Michael James Walock
Camilo Eduardo TÃ©llez
09 Oct 2011 | | Contributor(s):: Mario Renteria, Elliott Ivan Gurrola, Birkir Snær Sigfússon, Suhas Venkat Baddela, Sourabh Dongaonkar, Xingshu Sun, Muhammad Alam
Two dimensional spice simulation of thin film solar panels, including shunt induced variability, and partial shadow effects.
Comparison of strain relaxation in epitaxial Si0.3Ge0.7 films grown on Si(001) and Ge(001)
07 Oct 2011 | | Contributor(s):: Brian Demczyk, R. Naik, G. Auner, C. Kota, U. Rao
Surface and interfacial strain have been computed for SiGe thin films grown by UHVCVD,based on measurements via transmission electron microscopy and Raman spectroscopy.
Growth of Cu films on hydrogen terminated Si(lQ0) and Si(lll) surf&es
We have employed reflection high energy electron diffraction (RHEED) and high resolutiontransmission electron microscopy (HREM) to study Cu films grown on hydrogen terminatedSi( 100) and Si( 111) substrates by molecular beam epitaxy.
Interface structure and surface morphology of (Co, Fe, Ni)/Cu/Si(100) thin films
07 Oct 2011 | | Contributor(s):: Brian Demczyk, V.M. Naik, A. Lukaszew, R. Naik, G. W. Auner
We have examined bilayer Co/Cu, Fe/Cu, and Ni/Cu films deposited by molecular-beam epitaxy onhydrogen-terminated @100# silicon substrates.
Lubrication Effects on Head-Disk Spacing Loss
07 Oct 2011 | | Contributor(s):: Brian Demczyk, J. Liu, C. Y. Chen, S. Zhang
The effects of lubrication thickness on the magnetic recording head-media tribology were investigated in this study.
Magnetic properties of magnetron sputtered Co-Cr thin films
07 Oct 2011 | | Contributor(s):: Brian Demczyk, J. O. Artman
The magnetic properties 01 magnetron sputtered CO-22 at.% Cr films of various thickness deposited on glass have been examined, with particular attentionto the various contributions to the film anisotropy
Origin of the orientation ratio in sputtered longitudinal media
07 Oct 2011 | | Contributor(s):: Brian Demczyk, J. N. Zhou, G. Choe, E. Stach, E. C. Nelson, U. Dahmen
The surface morphology, thin film microstructure, and crystallography of sputtered longitudinalmedia were examined by atomic force and transmission electron microscopy.