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ECE 659 Lecture 5: Where is the Resistance?
27 Jan 2009 | Online Presentations | Contributor(s): Supriyo Datta
https://nanohub.org/resources/6169
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ECE 659 Lecture 4: Landauer Model
27 Jan 2009 | Online Presentations | Contributor(s): Supriyo Datta
https://nanohub.org/resources/6166
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ECE 659 Lecture 1: Introduction
21 Jan 2009 | Online Presentations | Contributor(s): Supriyo Datta
https://nanohub.org/resources/6145
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ECE 659 Lecture 2: Molecular, Ballistic and Diffusive Transport
21 Jan 2009 | Online Presentations | Contributor(s): Supriyo Datta
https://nanohub.org/resources/6148
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ECE 659 Lecture 3: Mobility
21 Jan 2009 | Online Presentations | Contributor(s): Supriyo Datta
https://nanohub.org/resources/6151
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ECE 612 Lecture 27: Heterojunction Bipolar Transistors
15 Dec 2008 | Online Presentations | Contributor(s): Mark Lundstrom
https://nanohub.org/resources/6047
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ECE 612 Lecture 26: Heterostructure FETs
10 Dec 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Introduction, 2) Heterojunction review, 3) Modulation doping, 4) I-V characteristics, 5) Device Structure / Materials, 6) Summary.
https://nanohub.org/resources/6032
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ECE 612 Lecture 25: SOI Electrostatics
08 Dec 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1. Introduction, 2. General solution, 3. VTF vs. VGB, 4. Subthreshold slope, 5. Double gate (DG) SOI, 6. Recap, 7. Discussion, 8. Summary.
https://nanohub.org/resources/6014
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ECE 612 Lecture 22: CMOS Circuit Essentials
24 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) The CMOS inverter, 2) Speed, 3) Power, 4) Circuit performance, 5) Metrics, 6) Limits. This lecture is an overview of CMOS circuits. For a more detailed presentation, the …
https://nanohub.org/resources/5927
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ECE 606 Lecture 32: MOS Electrostatics I
19 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam
https://nanohub.org/resources/5894
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ECE 606 Lecture 26: Schottky Diode II
19 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam
…
https://nanohub.org/resources/5830
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ECE 612 Lecture 18B: CMOS Process Flow
18 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
For a basic, CMOS process flow for an STI (shallow trench isolation process), see: http://www.rit.edu/~lffeee/AdvCmos2003.pdf. This lecture is a condensed version of the more complete presentation …
https://nanohub.org/resources/5855
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ECE 612 Lecture 20: Broad Overview of Reliability of Semiconductor MOSFET
14 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam
Guest lecturer: Muhammad A. Alam.
https://nanohub.org/resources/5861
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ECE 612 Lecture 19: Device Variability
14 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Sources of variability, 2) Random dopantfluctuations (RDF), 3) Line edge roughness (LER), 4) Impact on design.
https://nanohub.org/resources/5856
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ECE 612 Lecture 18A: CMOS Process Steps
12 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Unit Process Operations, 2) Process Variations.
https://nanohub.org/resources/5788
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Lecture 2: Thresholds, Islands, and Fractals
04 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam
Three basic concepts of the percolation theory – namely, percolation threshold, cluster size distribution, and fractal dimension – are defined and methods to calculate them are illustrated via …
https://nanohub.org/resources/5698
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Lecture 1: Percolation in Electronic Devices
04 Nov 2008 | Online Presentations | Contributor(s): Muhammad A. Alam
Even a casual review of modern electronics quickly convinces everyone that randomness of geometrical parameters must play a key role in understanding the transport properties. Despite the diversity …
https://nanohub.org/resources/5697
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ECE 612 Lecture 17: Gate Resistance and Interconnects
03 Nov 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Gate Resistance, 2) Interconnects, 3) ITRS, 4) Summary.
https://nanohub.org/resources/5700
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ECE 612 Lecture 16: MOSFET Leakage
31 Oct 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) MOSFET leakage components, 2) Band to band tunneling, 3) Gate-induced drain leakage, 4) Gate leakage, 5) Scaling and ITRS, 6) Summary.
https://nanohub.org/resources/5688
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ECE 612 Lecture 15: Series Resistance (and effective channel length)
29 Oct 2008 | Online Presentations | Contributor(s): Mark Lundstrom
Outline: 1) Effect on I-V, 2) Series resistance components, 3) Metal-semiconductor resistance, 4) Other series resistance components, 5) Discussion, 6) Effective Channel Length, 7) Summary.
https://nanohub.org/resources/5675