Tags: transmission electron microscopy

Papers (1-3 of 3)

  1. Structure and Morphology of Silicon Germanium Thin Films

    30 Dec 2013 | Contributor(s):: Brian Demczyk

    Single layer silicon and germanium films as well as nominally 50-50 silicon-germanium alloys were deposited on single crystal silicon and germanium (001) and (111) substrates by ultrahigh vacuum chemical vapor deposition. These films spanned the range of + 4 % film-substrate lattice mismatch. A...

  2. On the Two to Three Dimensional Growth Transition in Strained Silicon Germanium Thin Films

    02 Feb 2012 | | Contributor(s):: Brian Demczyk

    Utilizing a model adapted from classical nucleation theory [8], we calculate a "critical thickness" for island formation, taking into account the surfaceenergies of the deposit and the substrate and the elastic modulus of the deposit, to which experimental results for CVD grown silicon germanium...

  3. Boron Nitride Nanotube Growth Mode

    27 Jan 2012 | | Contributor(s):: Brian Demczyk

    This writeup details the growth details of arc-synthesized boron nitride nanotubes, incorporating the results of atomic resolution transmission electron microscopy, image simulation and image exit wave reconstruction techniques.This research was supported in part by the Director of the Office of...