Tags: traps

Teaching Materials (1-1 of 1)

  1. Atomistic Simulations of Reliability

    06 Jul 2010 | Contributor(s):: Dragica Vasileska

    Discrete impurity effects in terms of their statistical variations in number and position in the inversion and depletion region of a MOSFET, as the gate length is aggressively scaled, have recently been researched as a major cause of reliability degradation observed in intra-die and die-to-die...