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X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials
29 Dec 2009 | | Contributor(s):: Mauro Sardela
A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray...