Tags: tutorial

Resources (181-181 of 181)

  1. X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

    29 Dec 2009 | | Contributor(s):: Mauro Sardela

    A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the Birck Nanotechnology Center. Practical aspects of data acquisition and interpretation using x-ray...