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Tags: x-ray diffraction

Members (1-2 of 2)

  1. Dan Esposito

  2. Mauro Sardela

    Dr. Sardela holds a Ph.D. in Materials Science and Technology (Linkoping University, Sweden, 1994) with emphasis in x-ray scattering and characterization of semiconductor materials. He worked four..., a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.