Misinterpreting X-Ray Diffraction Results

03 Dec 2008 | Notes | Contributor(s): Thomas Key

Common mistakes and misinterpretations associated with the collection and interpretation of x-ray diffraction data.

https://nanohub.org/resources/5983

Modern X-ray Scattering Methods for Nanoscale Materials Analysis

15 Oct 2008 | Online Presentations | Contributor(s): Richard J. Matyi

Since its discovery by von Laue in 1912, X-ray diffraction has become an indispensable tool for structure determinations in the physical and biological sciences. X-rays are characterized by high …

https://nanohub.org/resources/5580

Nano*High: X-rays, Lasers, and Molecular Movies

25 Sep 2010 | Online Presentations | Contributor(s): Roger W. Falcone

X-ray imaging is an excellent method to make visible what would normally be invisible - who hasn't had an X-ray at the doctor or dentist's office before? At the Lawrence Berkeley National Lab, the …

https://nanohub.org/resources/8294

TiCN/TiNbCN Multilayer System with Enhanced Tribological Properties

20 Oct 2010 | Online Presentations | Contributor(s): Pedro Antonio Prieto

Improvement in the mechanical properties of hard coatings such monolayer (TiN, CrN, AlCN, WC-Co, TiCN) [1], has been achieved using compositional gradient WC/C layer, or multilayered type …

https://nanohub.org/resources/9912

X-ray Diffraction and Reflectivity Analysis of Thin Films and Nanomaterials

29 Dec 2009 | Online Presentations | Contributor(s): Mauro Sardela

A review of x-ray analysis techniques applied to the characterization of nanomaterials will be presented with focus on x-ray lab source instrumentation similar to the facilities available at the …

https://nanohub.org/resources/7955