Tags: X-Ray Photoelectron Spectroscopy


X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the physical and chemical properties of a material's surface. XPS uses a beam of X-rays to irradiate the material while simultaneously measuring the kinetic energy (KE) and the number of electrons that escape from within the top 10 to 12 nm of the material being analyzed. The resulting spetra of number of electrons vs. the kinetic energy is used to identify the elements present on the surface of the material being analyzed. For a more extensive description of XPS see WIkipedia.

Learn more about XPS from the resources on this site, listed below.

Papers (1-1 of 1)

  1. Surface structure and composition of high-surface-area molybdenum nitrides

    02 Feb 2012 | | Contributor(s):: Brian Demczyk, j. G. Choi, L. T. Thompson

    In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.