Tags: X-Ray Photoelectron Spectroscopy

Description

X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the physical and chemical properties of a material's surface. XPS uses a beam of X-rays to irradiate the material while simultaneously measuring the kinetic energy (KE) and the number of electrons that escape from within the top 10 to 12 nm of the material being analyzed. The resulting spetra of number of electrons vs. the kinetic energy is used to identify the elements present on the surface of the material being analyzed. For a more extensive description of XPS see WIkipedia.

Learn more about XPS from the resources on this site, listed below.

All Categories (1-20 of 22)

  1. BME 695L Lecture 14: Designing and Testing Integrated Nanomedical Systems

    22 Nov 2011 | | Contributor(s):: James Leary

    See references below for related reading.14.1      Introduction to integrated designs14.1.1    “Total design” but there is some order in the design process14.1.2    A brief outline of the total design...

  2. BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications

    01 Nov 2011 | | Contributor(s):: Dmitry Zemlyanov

    Guest lecturer: Dmitry Zemlyanov

  3. BME 695N Lecture 12: Introduction to X-ray Photoelectron Spectroscopy and the Examples of Biologically-Relevant Applications

    19 Oct 2007 | | Contributor(s):: Dmitry Zemlyanov

    With Dmitry Zemlyanov as guest lecturer.

  4. BNC Annual Research Symposium: Metrology and Nanomaterials Characterization

    10 May 2007 | | Contributor(s):: Ron Reifenberger

    This presentation is part of a collection of presentations describing the projects, people, and capabilities enhanced by research performed in the Birck Center, and a look at plans for the upcoming year.

  5. Characterization of 2D materials at Birck Surface Analysis Facility

    28 Sep 2016 | | Contributor(s):: Dmitry Zemlyanov

    Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

  6. CNDO/INDO

    09 Oct 2007 | | Contributor(s):: Baudilio Tejerina, Jeff Reimers

    Semi-empirical Molecular Orbital calculations.

  7. ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis

    04 Mar 2010 | | Contributor(s):: Dmitry Zemlyanov

    Guest Lecturer: Dmitry Zemlyanov

  8. ECET 499N: Introduction to Nanotechnology

    30 Mar 2009 | | Contributor(s):: Helen McNally

    An introduction to the emerging area of nanotechnology will be studied. The primary focus will be on the technologies of nanotechnology, with specific emphasis on electronics and electrical measurements. Instruments and techniques used in nanotechnology will be described and explored which...

  9. Federico Gramazio

    http://nanohub.org/members/131624

  10. Filippo Mangolini

    http://nanohub.org/members/71694

  11. Introduction to X-ray Photoelectron Spectroscopy and to XPS Applications

    17 May 2007 | | Contributor(s):: Dmitry Zemlyanov

    X-ray Photoelectron Spectroscopy (XPS), which is known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the surface of solids. The technique is widely used for studies of the properties of atoms, molecules, solids, and surfaces. The main success...

  12. Introduction to X-ray Photoelectron Spectroscopy and XPS Application for Biologically Related Objects

    14 Feb 2007 | | Contributor(s):: Dmitry Zemlyanov

    X-ray Photoelectron Spectroscopy (XPS), which is known as Electron Spectroscopy for Chemical Analysis (ESCA), is a powerful research tool for the study of the surface of solids. The technique becomes widely used for studies of the properties of atoms, molecules, solids, and surfaces. The main...

  13. Sep 22 2010

    Introduction to XPS: What you should know about X-ray photoelectron spectroscopy?

    XPS is widely used to determine the chemical composition of a surface (element concentrations, chemical states, lateral and depth distributions, etc.). Nowadays XPS has become a standard...

    http://nanohub.org/events/details/275

  14. Metal Oxide Nanowires as Gas Sensing Elements: from Basic Research to Real World Applications

    21 Sep 2009 | | Contributor(s):: andrei kolmakov

    Quasi 1-D metal oxide single crystal chemiresistors are close to occupy their specific niche in the real world of solid state sensorics. Potentially, the major advantage of this kind of sensors with respect to available granular thin film sensors will be their size and stable, reproducible and...

  15. Nanotechnology for Aerospace Research: Surface Science Applications

    29 Mar 2016 | | Contributor(s):: Dmitry Zemlyanov

    Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...

  16. Oligodeoxyribonucleotide Association with Single-Walled Carbon Nanotubes

    02 Aug 2007 | | Contributor(s):: Jennifer McDonald

    Commercially available single-walled carbon nanotubes (SWCNTs) tend to aggregate as ropes and bundles during production making them of little use in many scientific and industrial applications. An effective technique for dispersing and solubilizing SWCNTs is required to fully utilize their...

  17. Surface Characterization Studies of Carbon Materials: SS-DNA, SWCNT, Graphene, HOPG

    30 Jan 2010 | | Contributor(s):: Dmitry Zemlyanov

    In this presentation examples of surface characterization studies of carbon specimens will be presented. (1) In particularly, the systematic XPS (X-ray photoelectron spectroscopy) characterization of graphene grown on the SiC surface will be reported. This work demonstrates a use for XPS to...

  18. Surface structure and composition of high-surface-area molybdenum nitrides

    31 Jan 2012 | | Contributor(s):: Brian Demczyk, j. G. Choi, L. T. Thompson

    In this work, we have employed high-resolutiontransmission electron microscopy coupled with Fourier analysis, and X-ray photoelectron spectroscopy todetermine the near-surface structures and compositions of a series of molybdenum nitride catalysts.

  19. X-Ray Photoelectron Spectroscopy (XPS)

    14 Dec 2006 | | Contributor(s):: David Echevarria Torres

    The XPS (X-Ray Photoelectron Spectroscopy) it is also known as ESCA (Electron Spectroscopy for Chemical Analysis). This technique is based on the theory of the photoelectric effect that was developed by Einstein, yet it was Dr. Siegbahn and his research group who developed the XPS technique. The...

  20. X-ray Photoelectron Spectroscopy (XPS) Tour

    24 Jan 2008 | | Contributor(s):: Dmitry Zemlyanov

    A guided tour, given by Dmitry Zemlyanov, of the X-ray Photoelectron Spectroscopy (XPS) lab located in the Birck Nanotechnology Center at Purdue University.