Support

Support Options

Submit a Support Ticket

 

ACUTE—Assembly for Computational Electronics

by Dragica Vasileska, Gerhard Klimeck, Xufeng Wang, Stephen M. Goodnick, Margaret Shepard Morris, Michael Anderson, Philathia Rufaro Bolton, Cristina Leal Gonzalez, Craig Titus, Jamie E Hickner

Version 42
by Dragica Vasileska
Version 43
by Gerhard Klimeck

Deletions or items before changed

Additions or items after changed

1 -
[[Div(start, class=clear)]][[Div(end)]]
2 -
3 [[Image(picture_11.png, 500 class=align-left)]]
4 [[Div(start, class=clear)]][[Div(end)]]
5
6 The purpose of the ACUTE tool-based curricula is to introduce interested scientists from Academia and Industry in advanced simulation methods needed for proper modeling of state-of-the-art nanoscale devices. The multiple scale transport in doped semiconductors is summarized in the figure below in terms of the transport regimes, relative importance of the scattering mechanisms and possible applications.
7
8 [[Image(intro1.png, 250 class=align-left)]]
9 [[Div(start, class=clear)]][[Div(end)]]
10
11 Relationship between various transport regimes and significant length-scales.
12
13 [[Image(intro2.png, 250 class=align-left)]]
14 [[Div(start, class=clear)]][[Div(end)]]
15
16 We first discuss the energy bandstructure that enters as an input to any device simulator. We then begin with the discussion of simulators that involve the drift-diffusion model, and then move into simulations that involve hydrodynamic and energy balance transport and conclude the semi-classical transport modeling with application of particle-based device simulation methods.
17
18 Having discussed and utilized the semiclassical simulation tools and their applications, we then move into inclusion of quantum corrections into classical simulators. The final set of tools is dedicated to the far-from equilibrium transport, where we will utilize the concept of pure and mixed states and the distribution function. Several tools that utilize different methods will be used for that purpose. We will utilize tools that use the recursive Green’s function method and its variant, the Usuki method. Also, we will utilize the Contact Block Reduction tool as the most efficient and most complete way of solving the quantum transport problem since this method allows one to simultaneously calculate source-drain current and gate leakage which is not the case, for example, with the Usuki and the recursive Green’s function techniques that are in fact quasi-1D in nature for transport through a device. A table that shows the advantages and the limitation of various semi-classical and quantum transport simulation tools is presented below.
19
20 [[Image(intro3.png, 250 class=align-left)]]
21 [[Div(start, class=clear)]][[Div(end)]]
22
23 More details on the actual tool design and information on commercial tool usage can be found on the web pages:
24
25 [[Resource(4921)]]
26
27 [[Resource(5092)]]
28
29
30
31 == Energy Bands and Effective Masses ==
32
33 === [/tools/acute/ Piece-Wise Constant Potential Barrier Tool in ACUTE]– Open Systems ===
34
35 The [/tools/acute/ Piece-Wise Constant Potential Barrier Tool in ACUTE] allows calculation of the transmission and the reflection coefficient of arbitrary five, seven, nine, eleven and 2n-segment piece-wise constant potential energy profile. For the case of multi-well structure it also calculates the quasi-bound states so it can be used as a simple demonstration tool for the formation of energy bands.
36
37 [[Image(pcpbt.png, 200 class=align-left)]]
38 [[Div(start, class=clear)]][[Div(end)]]
39
40 Also, it can be used in the case of stationary perturbation theory exercises to test the validity of, for example, the first order and the second order correction to the ground state energy of the system due to small perturbations of, for example, the confining potential. The PCPBT tool can also be used to test the validity of the WKB approximation for triangular potential barriers.
41
42 [[Div(start, class=clear)]][[Div(end)]]
43
44 Exercises:
45
46 [[Div(start, class=clear)]][[Div(end)]]
47
48 * [[Resource(4831)]]
49
50 * [[Resource(4833)]]
51
52 * [[Resource(4853)]]
53
54 * [[Resource(4873)]]
55
56 * [[Resource(5319)]]
57
58 * [[Resource(4849)]]
59
60 * [[Resource(5102)]]
61
62 * [[Resource(5130)]]
63
64 [[Div(start, class=clear)]][[Div(end)]]
65
66
67 === [/tools/acute/ Periodic Potential Lab in ACUTE] ===
68
69 The [/tools/acute/ Periodic Potential Lab in ACUTE] solves the time independent Schroedinger Equation in a 1-D spatial potential variation. Rectangular, triangular, parabolic (harmonic), and Coulomb potential confinements can be considered. The user can determine energetic and spatial details of the potential profiles, compute the allowed and forbidden bands, plot the bands in a compact and an expanded zone,
70
71 [[Image(ppl.png, 250 class=align-left)]]
72 [[Div(start, class=clear)]][[Div(end)]]
73
74 and compare the results against a simple effective mass parabolic band. Transmission is also calculated. This Lab also allows the students to become familiar with the reduced zone and expanded zone representation of the dispersion relation (E-k relation for carriers).
75
76 Exercises:
77
78 * [[Resource(4851)]]
79
80 [[Div(start, class=clear)]][[Div(end)]]
81
82
83 === [/tools/acute/ Bandstructure Lab in ACUTE] ===
84
85 In solid-state physics, the electronic band structure (or simply band structure) of a solid describes ranges of energy that an electron is "forbidden" or "allowed" to have. It is due to the diffraction of the quantum mechanical electron waves in the periodic crystal lattice. The band structure of a material determines several characteristics, in particular its electronic and optical properties. The [/tools/acute/ Bandstructure Lab in ACUTE] tool enables the study of bulk dispersion relationships of Si, !GaAs, !InAs. Plotting the full dispersion relation of different materials, students first get familiar with a band-structure of direct band-gap (!GaAs, !InAs) and indirect band-gap semiconductors (Si). For the case of multiple conduction band valleys one has to determine first the Miller indices of one of the equivalent valleys and from that information it immediately follows how many equivalent conduction bands one has in Si and Ge, for example.
86
87 [[Image(bsl.png, 250 class=align-left)]]
88 [[Div(start, class=clear)]][[Div(end)]]
89
90 In advanced applications, the users can apply tensile and compressive strain and observe the variation in the bandstructure, bandgaps, and effective masses. Advanced users can also study bandstructure effects in ultra-scaled (thin body) quantum wells, and nanowires of different cross sections. Bandstructure Lab uses the sp3s*d5 tight binding method to compute E(k) for bulk, planar, and nanowire semiconductors.
91
92 Exercises:
93
94 * [[Resource(5201)]]
95
96 * [[Resource(5031)]]
97
98 * [[Resource(4890)]]
99
100 * [[Resource(4880)]]
101
102
103 [[Div(start, class=clear)]][[Div(end)]]
104
105
106 ==Drift-Diffusion and Energy Balance Simulations==
107
108
109 === [/tools/acute/ PADRE Tool in ACUTE] – Modeling of Si-based devices===
110
111 [/tools/acute/ PADRE Tool in ACUTE] is a 2D/3D simulator for electronic devices, such as MOSFET transistors.
112
113 [[Image(padre.png, 250 class=align-left)]]
114 [[Div(start, class=clear)]][[Div(end)]]
115
116 It can simulate physical structures of arbitrary geometry--including heterostructures--with arbitrary doping profiles, which can be obtained using analytical functions or directly from multidimensional process simulators such as Prophet.
117 For each electrical bias, [/tools/acute/ PADRE Tool in ACUTE] solves a coupled set of partial differential equations (PDEs). A variety of PDE systems are supported which form a hierarchy of accuracy: (1) electrostatic (Poisson equation), (2) drift-diffusion (including carrier continuity equations), (3) energy balance (including carrier temperature) and (4) electrothermal (including lattice heating).
118
119 Several example problems that utilize [/tools/acute/ PADRE Tool in ACUTE] are given below:
120
121 * [[Resource(229)]]
122
123 * [[Resource(4894)]]
124
125 * [[Resource(4896)]]
126
127 * [[Resource(452)]]
128
129 * [[Resource(4906)]]
130
131 * [[Resource(3984)]]
132
133 * [[Resource(5051)]]
134
135 A variety of supplemental documents are available that deal with the PADRE software and TCAD simulation:
136
137 * [/site/resources/tools/padre/doc/index.html User Manual]
138
139 * [/site/resources/2006/06/01581/intro_dd_padre_word.pdf Abbreviated First Time User Guide]
140
141
142 A set of course notes on Computational Electronics with detailed explanations on bandstructure, pseudopotentials, numerical issues, and drift diffusion is also available.
143
144 * [[Resource(1516)]]
145
146 * [[Resource(980)]]
147
148
149 ===SILVACO Simulator – Modeling of Si-based and III-V devices===
150
151 In preparation.
152
153
154
155 == Particle-Based Simulators ==
156
157 === [/tools/acute/ Bulk Monte Carlo Lab in ACUTE] ===
158
159 [[Image(mc.png, 250 class=align-left)]]
160 [[Div(start, class=clear)]][[Div(end)]]
161
162 The [/tools/acute/ Bulk Monte Carlo Lab in ACUTE] calculates the bulk values of the electron drift velocity, electron average energy and electron mobility for electric fields applied in arbitrary crystallographic direction in both column 4 (Si and Ge) and III-V (GaAs, SiC and GaN) materials. All relevant scattering mechanisms for the materials being considered have been included in the model.
163
164 [[Image(scattering.png, 250 class=align-left)]]
165 [[Div(start, class=clear)]][[Div(end)]]
166
167 Detailed derivation of the scattering rates for most of the scattering mechanisms included in the model can be found on Prof. Vasileska personal web-site http://www.eas.asu.edu/~vasilesk (look under class EEE534 Semiconductor Transport). Description of the Monte Carlo method used to solve the Boltzmann Transport Equation and implementation details of the tool are given in the
168
169 [[Resource(4843)]]
170
171 Available also is a voiced presentation
172
173 [[Resource(4439)]]
174
175 that gives more insight on the implementation details of the Ensemble Monte Carlo technique for the solution of the Boltzmann Transport Equation. Examples of simulations that can be performed with this tool are given below:
176
177 [[Resource(4845)]]
178
179 Exercises:
180
181 * [[Resource(5047)]]
182
183 * [[Resource(5277)]]
184
185 * [[Resource(5275)]]
186
187 * [[Resource(5321)]]
188
189 * [[Resource(5323)]]
190
191
192 === [/tools/acute/ Quamc2D Lab in ACUTE] ===
193
194 [/tools/acute/ Quamc2D Lab in ACUTE] (pronunciation: quamsee) 2-D is effectively a quasi three-dimensional quantum-corrected semiclassical Monte Carlo transport simulator for conventional and non-conventional MOSFET devices.
195
196 [[Image(quamc2d1.png, 250 class=align-left)]]
197 [[Div(start, class=clear)]][[Div(end)]]
198
199 Device structures that can be simulated.
200
201 [[Image(quamc2d2.png, 250 class=align-left)]]
202 [[Div(start, class=clear)]][[Div(end)]]
203
204 Phenomena that can be explained
205
206 A parameter-free quantum field approach has been developed and utilized quite successfully in order to capture the size-quantization effects in nanoscale MOSFETs. The method is based on a perturbation theory around thermodynamic equilibrium and leads to a quantum field formalism in which the size of an electron depends upon its energy. This simulator uses different self-consistent event-biasing schemes for statistical enhancement in the Monte-Carlo device simulations. Enhancement algorithms are especially useful when the device behavior is governed by rare events in the carrier transport process. A bias technique, particularly useful for small devices, is obtained by injection of hot carriers from the boundaries. Regarding the Monte Carlo transport kernel, the explicit inclusion of the longitudinal and transverse masses in the silicon conduction band is done in the program using the Herring-Vogt transformation. Intravalley scattering is limited to acoustic phonons. For the intervalley scattering, both g- and f-phonon processes have been included.
207
208 * [[Resource(4520)]]
209
210 * [[Resource(4543)]]
211
212 * [[Resource(4443)]]
213
214 * [[Resource(4439)]]
215
216 * [[Resource(5127)]]
217
218 Exercises:
219
220
221 ===Thermal Particle-Based Device Simulator===
222
223 In preparation.
224
225
226
227 ==Inclusion of Quantum Corrections into Semi-Classical Simulation Tools==
228
229
230 === [/tools/acute/ SCHRED in ACUTE] ===
231
232 [/tools/acute/ SCHRED in ACUTE] calculates the envelope wavefunctions and the corresponding bound-state energies in a typical MOS (Metal-Oxide-Semiconductor) or SOS (Semiconductor-Oxide- Semiconductor) structure and a typical SOI structure by solving self-consistently the one-dimensional (1D) Poisson equation and the 1D Schrodinger equation.
233
234 [[Image(schred.png, 250 class=align-left)]]
235 [[Div(start, class=clear)]][[Div(end)]]
236
237 To better understand the operation of [/tools/acute/ SCHRED in ACUTE] tool and the physics of MOS capacitors please refer to:
238
239 * [[Resource(4794)]]
240
241 * [[Resource(4796)]]
242
243 * [[Resource(5087)]]
244
245 * [[Resource(5127)]]
246
247 Exercises:
248
249 * [[Resource(4900)]]
250
251 * [[Resource(4902)]]
252
253 * [[Resource(4904)]]
254
255
256 === [/tools/acute/ 1D Heterostructure Tool in ACUTE] ===
257
258 The [/tools/acute/ 1D Heterostructure Tool in ACUTE] simulates confined states in 1D heterostructures by calculating charge self-consistently in the confined states, based on a quantum mechanical description of the one dimensional device. The greater interest in HEMT devices is motivated by the limits that will be reached with scaling of conventional transistors. The [/tools/acute/ 1D Heterostructure Tool in ACUTE] in that respect is a very valuable tool for the design of HEMT devices as one can determine, for example, the position and the magnitude of the delta-doped layer, the thickness of the barrier and the spacer layer for which one maximizes the amount of free carriers in the channel which, in turn, leads to larger drive current. This is clearly illustrated in the examples below.
259
260 [[Image(1dhet1.png, 180 class=align-left)]]
261 [[Image(1dhet2.png, 180 class=align-left)]]
262 [[Div(start, class=clear)]][[Div(end)]]
263
264 Exercises:
265
266 * [[Resource(5231)]]
267
268 * [[Resource(5233)]]
269
270
271 The most commonly used semiconductor devices for applications in the GHz range now are !GaAs based MESFETs, HEMTs and HBTs. Although MESFETs are the cheapest devices because they can be realized with bulk material, i.e. without epitaxially grown layers, HEMTs and HBTs are promising devices for the near future. The advantage of HEMTs and HBTs is a factor of 2 to 3 higher power density compared to MESFETs which leads to significantly smaller chip size.
272
273 HEMTs are field effect transistors where the current flow between two ohmic contacts, Source and Drain, and it is controlled by a third contact, the Gate. Most often the Gate is a Schottky contact. In contrast to ion implanted MESFETs, HEMTs are based on epitaxially grown layers with different band gaps Eg.
274
275
276
277 ==Quantum Transport==
278
279
280 === Recursive Green's Function Method for Modeling RTD's===
281
282 in preparation.
283
284
285 === [/tools/acute/ nanoMOS in ACUTE] ===
286
287 [/tools/acute/ nanoMOS in ACUTE] is a 2-D simulator for thin body (less than 5 nm), fully depleted, double-gated n-MOSFETs. A choice of five transport models is available (drift-diffusion, classical ballistic, energy transport, quantum ballistic, and quantum diffusive). The transport models treat quantum effects in the confinement direction exactly and the names indicate the technique used to account for carrier transport along the channel. Each of these transport models is solved self-consistently with Poisson's equation. Several internal quantities such as subband profiles, subband areal electron densities, potential profiles and I-V information can be obtained from the source code.
288
289 [[Image(nanomos.png, 250 class=align-left)]]
290 [[Div(start, class=clear)]][[Div(end)]]
291
292 [[Resource(1305)]] 3.0 includes an improved treatment of carrier scattering. Some important information about [/tools/acute/ nanoMOS in ACUTE] can be found on the following links:
293
294 * [[Resource(2845)]]
295
296 * [[Resource(1533)]]
297
298
299 ===CBR===
300
301 in preparation.
302
303
304
305 ==Atomistic Modeling==
306
307
308 === [/tools/acute/ NEMO3D in ACUTE] ===
309
310 [/tools/acute/ NEMO3D in ACUTE] calculates eigenstates in (almost) arbitrarily shaped semiconductor structures in the typical column IV and III-V materials. Atoms are represented by the empirical tight binding model using s, sp3s*, or sp3d5s* models with or without spin. Strain is computed using the classical valence force field (VFF) with various Keating-like potentials.
311
312 [[Image(modeling_agenda5.gif, 250 class=align-left)]]
313 [[Div(start, class=clear)]][[Div(end)]]
314
315 [/tools/acute/ NEMO3D in ACUTE] has been used to analyze quantum dots, alloyed quantum dots, long range strain effects on quantum dots, effects of wetting layers, piezo-electric effects in quantum dots, quantum dot nuclear spin interactions, quantum dot phonon spectra, coupled quantum dot systems, miscut Si quantum wells with SiGe alloy buffers, core-shell nanowires, allyed nanowires, phosphorous impurities in Silicon (P:Si qbits), bulk alloys.
316
317 [[Image(qdot.png, 250 class=align-left)]]
318 [[Div(start, class=clear)]][[Div(end)]]
319
320 Boundary conditions to treat the effects of (surface states have been developed. Direct and exchange interactions and interactions with electromagnetic fields can be computed in a post-processing approach based on the NEMO 3-D single particle states.
321
322 Exercises:
323
324 * [[Resource(450)]]
325
326 * [[Resource(2925)]]
327
328
329 == Collection of tools that comprise ACUTE ==
330
331 [[Resource(4826)]]
332
333 [[Resource(3847)]]
334
335 [[Resource(1308)]]
336
337 [[Resource(941)]]
338
339 [[Resource(4438)]]
340
341 [[Resource(1092)]]
342
343 [[Resource(221)]]
344
345 [[Resource(5203)]]
346
347 [[Resource(1305)]]
348
349 [[Resource(450)]]

nanoHUB.org, a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.