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  1. Two-Stage Model

    27 Jun 2017 | Downloads | Contributor(s): Rakesh P Rao, Narendra Parihar, Souvik Mahapatra

    This simulator calculates the kinetics associated with trapping and trap generation during Negative Bias Temperature Instability (NBTI) in SiO2 (or SiON) based Si p-MOSFETs. The calculations...

    http://nanohub.org/resources/26750