What's New: Past Month

Online Presentations feed

  1. Characterization of 2D materials at Birck Surface Analysis Facility

    28 Sep 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov

    Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material...

    http://nanohub.org/resources/25042

  2. ECE 695Q Lecture 36: Nanoimprint Lithography (NIL) – Alignment in NIL

    28 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24960

  3. ECE 695Q Lecture 39: Nanoimprint Lithography (NIL) – NIL Tools

    26 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/25001

  4. ECE 695Q Lecture 40: Nanoimprint Lithography (NIL) – Other NIL Approaches

    26 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/25002

  5. ECE 695Q Lecture 31: Scanning Helium Ion Microscopy (SHIM)

    26 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24471

  6. Auger Generation as an Intrinsic Limit to Tunneling Field-Effect Transistor Performance

    22 Sep 2016 | Online Presentations | Contributor(s): Jamie Teherani

    Many in the microelectronics field view tunneling field-effect transistors (TFETs) as society’s best hope for achieving a > 10× power reduction for electronic devices; however,...

    http://nanohub.org/resources/24982

  7. Collective Sensing by Communicating Cells

    22 Sep 2016 | Online Presentations | Contributor(s): Andrew Mugler

    In this talk I will describe recent theoretical and experimental results in which this question is explored in several contexts, including gradient detection by groups of epithelial cells. I will...

    http://nanohub.org/resources/24995

  8. ECE 695Q Lecture 30: Deposit Composition (Carbon/Metal)

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24470

  9. ECE 695Q Lecture 32: Nanoimprint Lithography (NIL) – Overview and Thermal NIL Resists

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24956

  10. ECE 695Q Lecture 33: Nanoimprint Lithography – Residual Layer After Nanoimprint

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24957

  11. ECE 695Q Lecture 34: Nanoimprint Lithography – Pattern Dependence in Nanoimprint

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24958

  12. ECE 695Q Lecture 35: Nanoimprint Lithography – UV Assisted Nanoimprint

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24959

  13. ECE 695Q Lecture 28: Focused Ion Beam Induced Deposition

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24468

  14. ECE 695Q Lecture 26: Non-Lithographic Applications of FIB

    21 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24466

  15. ECE 695Q Lecture 21: E-Beam Lithography Process

    20 Sep 2016 | Online Presentations | Contributor(s): Minghao Qi

    http://nanohub.org/resources/24444

  16. Career Development

    20 Sep 2016 | Online Presentations | Contributor(s): Gerhard Klimeck

    http://nanohub.org/resources/24947

  17. High Accuracy Atomic Force Microscope with Self-Optimizing Scan Control

    19 Sep 2016 | Online Presentations | Contributor(s): Ryan (Young-kook) Yoo

    Atomic force microscope (AFM) is a very useful instrument in characterizing nanoscale features, However, the original AFM design, based on piezo-tube scanner, had slow response and non-orthogonal...

    http://nanohub.org/resources/24927

  18. NEMO5, a Parallel, Multiscale, Multiphysics Nanoelectronics Modeling Tool


    19 Sep 2016 | Online Presentations | Contributor(s): Gerhard Klimeck

    The Nanoelectronic Modeling tool suite NEMO5 is aimed to comprehend the critical multi-scale, multi-physics phenomena and deliver results to engineers, scientists, and students through efficient...

    http://nanohub.org/resources/24932