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  1. nMOSFET RF and noise model on standard 45nm SOI technology 01 Jan 2017 | Compact Models | Contributor(s): Yanfei Shen, Saeed Mohammadi

    A compact scalable model suitable for predicting high frequency noise and nonlinear behavior of N-type Metal Oxide Semiconductor (NMOS) transistors is presented.

    http://nanohub.org/publications/160