ECE 606: Solid State Devices - Professors Muhammad A. Alam and Mark Lundstrom
Course overview Offering: 01a Section: Default
Video
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1. ECE606: Solid State Devices Le…
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2. Outline
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3. Topic Map
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4. Various Regions of I-V Charact…
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5. Applying Bias
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6. (4,6) Junction Recombination
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7. (np) Product within the Juncti…
328.1
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8. Electron/Hole Concentrations a…
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9. Junction Recombination
447.96666666666664
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10. Junction Recombination in Forw…
560.8
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11. Junction Leakage in Practice
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12. Junction Recombination in Reve…
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13. Outline
883.5
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14. Avalanche Breakdown
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15. Nonlinearity due to Impact-Ion…
906.1
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16. Impact-ionization and Flux Con…
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17. Impact-ionization
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18. Impact-ionization
1730.2
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19. Impact-ionization: In Practice
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20. Junction Engineering
2163.1
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21. Modern Considerations: Dead Sp…
2321.4
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22. Zener Breakdown vs. Impact Ion…
2422.2
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23. Conclusion
2654.9
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