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02 Jul 2014

  • Nano-Plasmonic Bowtie Antenna Simulator

    Featured 02 Jul 2014 in Resources (non-tools)

    A tool for simulating the near-field enhancement effects of nano-scale bowtie antennae.
  • High-Aspect-Ratio Micromachining of Titanium: Enabling New Functionality and Opportunity in Micromechanical Systems Through Greater Materials Selection

    Featured 02 Jul 2014 in Resources (non-tools)

    Traditionally, materials selection has been limited in high-aspect-ratio micromechanical applications, due primarily to the predominance of microfabrication processes and infrastructure dedicated to silicon. While silicon has proven to be an excellent material for many of these applications, no...
  • Thermal Conductance of solid-Solid and Solid-Liquid Interfaces

    Featured 02 Jul 2014 in Resources (non-tools)

    The thermal conductance of interfaces is a key factor in controlling thermal conduction in nanostructured materials, composites, and individual nanostructures. We have recently advanced the state-of-the-art of time-domain-thermoreflectance (TDTR) measurements of thermal transport and are using...
  • Bulk Si eff. mass vs. biaxial Strain

    Featured 02 Jul 2014 in Answers

    Asked by Ashish Agrawal - 2 years 11 months ago - 2 responses

    Hello there, I was simulating Strain sweep on Bulk Si. I applied biaxial strain from -0.015 to 0.015 in 001 direction. I am interested in hole effective mass change as a function of strain. For the HH effmass vs. strain data, the eff mass for strain=0 is 1/2 of the bulk case (0.049m0) as given...

01 Jul 2014


    Featured 01 Jul 2014 in Resources (non-tools)

    Use SIESTA to perform electronic structure calculations
  • Mechanical Properties of Surfactant Aggregates at Water-Solid Interfaces

    Featured 01 Jul 2014 in Resources (non-tools)

    This is a talk on the mechanical properties of surfactant aggregates at water-solid interfaces using Micelle-MD. This includes silica indentations of micelles with comparison to experimental data and graphite indentation of Micelle.
  • MOS Capacitors: Description and Semiclassical Simulation With PADRE

    Featured 01 Jul 2014 in Resources (non-tools)

    Introduction of Quantum-Mechanical Effects in Device Simulation
  • How do I get access to the tools offered on this site?

    Featured 01 Jul 2014 in Answers

    Asked by Paul Koecher - 5 years 1 month ago - 1 response

    Having attended a talk by Arvind Raman just a few days ago, I wanted to try out some of the VEDA tools he mentioned for myself. I registered here at nanoHUB only to find that all the tools I try to use, including the VEDA ones, are off limits to me. How can I change this?

30 Jun 2014

29 Jun 2014

  • StrainBands

    Featured 29 Jun 2014 in Resources (non-tools)

    Explore the influence of strain on first-principles bandstructures of semiconductors.
  • Simulation of highly idealized, atomic scale MQCA logic circuits

    Featured 29 Jun 2014 in Resources (non-tools)

    Spintronics logic devices based on majority gates formed by atomic-level arrangements of spins in the crystal lattice is considered. The dynamics of switching is modeled by time-dependent solution of the density-matrix equation with relaxation. The devices are shown to satisfy requirements for...
  • ECE 659 Lecture 27: Level Broadening: Self Energy

    Featured 29 Jun 2014 in Resources (non-tools)

    Reference Chapter 8.2
  • Useful for very high doping reverse bias conditions?

    Featured 29 Jun 2014 in Answers

    Asked by Philip David Flammer - 3 years 7 months ago - 1 response

    I want to know how suitable this tool is for calculating IV characteristics for very high doped pn junctions into the 10(18) – 10(19) /cm3 under reverse bias conditions. It seems like as you increase the carrier concentrations to these high levels there should be more reverse current..., a resource for nanoscience and nanotechnology, is supported by the National Science Foundation and other funding agencies. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation.