Characterization and Metrology
Graduate Courses
Atomic Force Microscopy
Fundamentals of Atomic Force Microscopy
ME 597/ PHYS 570 at Purdue University (Fall 2009) 28 Lectures
Taught by Ron Reifenberger and Arvind Raman
Selected Topics: quantum mechanics, tunneling, STM, interactions forces, dynamic AFM, modeling, cantilever eigenmodes, phase contrast, peak forces, electrostatic forces, nanolighography
Fundamentals of Atomic Force Microscopy
ME 597/ PHYS 570 at Purdue University (Fall 2010). 27 Lectures.
Taught by Ron Reifenberger and Arvind Raman
Selected Topics: quantum tunneling, STM, transition from STM to AFM, interaction forces, contact mechanics, force distance curves, calibrations, virtual environments, dynamic AFM, cantilever eigenmodes, peak forces, frequency modulated AFM,
VEDA Manual
VIRTUAL ENVIRONMENT FOR DYNAMIC AFM Version 2.0 First Time User’s Manual
AFM Metrology of Cellulose Nanocrystals
By Robert J. Moon1, Ryan Wagner2
1. Materials Engineering, Purdue University, West Lafayette, IN 2. Mechanical Engineering, Purdue University, West Lafayette, IN
Optical Microscopy
Optical Imaging
ECE 460 at University of Illinois at Urbana-Champaign (2011) 26 Lectures.
Taught by Gabriel Popescu
Selected Topics: math toolbox, properties of light, geometrical optics, eye opticals, wave optics, fourier optics, spatial/temporal fields, coherence, scalar fields, Gaussian beams, Jones matrices
Principles of Optical Imaging
ECE 460 at University of Illinois at Urbana-Champaign (Fall 2008). 6 Lectures.
Taught by Gabriel Popescu
Selected Topics: electrical magnetic fields, frequency domain, Green’s function, Fourier transformation, geometrical optics, Fermat’s principle, Snell’s Law, Schlieren Method, light scattering, transport equation
Modern Light Microscopy
ECE 564 at University of Illinois at Urbana-Champaign (2016).
Taught by Gabriel Popescu
This course covers current research topics in modern light microscopy: optics principles (statistical optics, Gaussian optics, elastic light scattering, dynamic light scattering); traditional microscopy (bright field, dark field, DIC, phase contract, confocal, epi-fluorescence, confocal fluorescence); current research topics (multiphoton, CARS, STED, FRET, FIONA, STORM, PALM, quantitative phase).
An earlier version of this course is also available:
ECE 564 at University of Illinois at Urbana-Champaign (Fall 2012). 15 Lectures.
Taught by Gabriel Popescu
Selected Topics: quantitative phase imaging in biomedicine, Fourier transforms, Gaussian beams, dispersive media, inhomogeneous media, light scattering, coherence
Electron Microscopy
Scanning Electron Microscope
By John C. Bean
University of Virginia, Charlottesville, VA
This resource describes a scanning electron microscope (SEM). It includes detailed depictions of how the electron beam is focused and used to create hugely magnified images of experimental specimens. It was created as part of the University of Virginia Virtual Science Lab.
Introduction to Scanning Electron Microscopy (SEM)
Introduction to Field Emission Scanning Electron Microscopy (FESEM)
Advanced Scanning Probe Microscopy I
Advanced Scanning Probe Microscopy II
Operational Overview of the Veeco Innova Scanning Probe Microscope (SPM)
Transmission Electron Microscopy Skills
MSE 582 at Purdue University (2008) 12 Lectures.
Taught by Eric Stach (2008).
Selected Topics: electrons, detection, vacuum science, sample preparation, scattering, diffraction, high-resolution TEM, electron microscopy
Transmission Electron Microscopy and Crystalline Imperfections
MSE 640 at Purdue University (2008) 16 Lectures.
Taught by Eric Stach (2008).
Selected Topics: elastic scattering, Laue diffraction, reciprocal lattice, crystals, planar faults, phase contrast, high-resolution TEM, STEM imaging, x-ray production, EELS
Electronic Characterization
Device Characterization with the Keithley 4200-SCS
Purdue University (2010) 12 Lectures.
Taught by Lee Stauffer
Selected Topics: DCi-V Source measurement, Keithley interactive test environment (KITE), operation and measurement, measurement techniques, ultra fast I-V
Other Characterization Methods
Fundamentals of Particle Image Velocimetry
Purdue University (2014)
Taught by Steve Wereley
Selected Topics: Tracer Particles, Particle Flow, Seeding, Illumination, Recording, Cameras, Image Analysis.
Sequencing a Genome by a Torrent of Ions: How an Old pH-Meter Got Its Groove Back
The ability to read the book of life, written in the genome of an organism, has been one of the most exciting development of our time. The first version of human genome was announced circa 2000 and it took a decade of industrial-scale collaboration and billions of dollars of funding. Today, we do the same for a few hundred dollars, and in a few hours time. In merely 10 years, the reactors that covered a football field has been reduced to the size of a postage-stamp. This seminar explains how a synthesis of electronics and biotechnology, especially the use of electronic biosensor made of i-phone scale transistors, has made this fantastic development possible.