Characterization and Metrology

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Created: 17 Dec 2013
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Introductory Material

  1. characterization
  2. metrology
  3. NCN Group - Characterization and Metrology

Nanotechnology Characterization

This resource provides and overview of several nanotechnology characterization techniques, including UV-Vis absorption, Dynamic Light Scattering (DLS), Optical Microscopy, SEM, TEM, AFM, STM, and Profilometry.