RON REIFENBERGER has been on the faculty at Purdue University since 1978, and he brings over 30 years’ experience in teaching introductory-level and undergraduate-level physics courses. His research focus has been scanning probe microscopy since 1985. Prof.Reifenberger is the director of the Kevin G. Hall Nanometrology Laboratory in the Birck Nanotechnology Center at Purdue.
ARVIND RAMAN, professor of mechanical engineering and University Faculty Scholar at Purdue, has held visiting positions at the Universidad Autónoma de Madrid, Spain; University of Oxford (Wadham College); and Darmstadt University of Technology, Germany. Prof. Raman has received the Gustus Larson Memorial Award from the ASME, the CAREER award from the National Science Foundation, and has published more than 100 journal papers. His group developed and maintains VEDA, Virtual Environment for Dynamic AFM, one of the most-used simulation tools for AFM.
Professors Arvind Raman and Ron Reifenberger have developed two web-based courses in response to enthusiastic feedback received for video lectures posted on nanoHUB.org that discussed all aspects of scanning probe microscopy (SPM). The original video lectures have attracted over 7,000 viewers worldwide. The course content has been refined and condensed from the original full-semester course offered at Purdue University beginning in 2009 into two, five-week online courses. The courses develop a unified framework for understanding the multifaceted aspects of atomic force microscopy.
The course material of Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods is available as a self-paced class taken online.
The atomic force microscope (AFM) is a key enabler of nanotechnology, and a proper understanding of how this instrument operates requires a broad-based background in many disciplines. Few users of AFM have the opportunity or resources to rapidly acquire the interdisciplinary knowledge that allows an intelligent operation of this instrument. This focused, in-depth course solves this problem by presenting a unified discussion of the fundamentals of atomic force microscopy. By registering for this course, students will be exposed to the knowledge base required to understand how an AFM operates.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods provides an in-depth treatment of dynamic mode AFM.
As the use of AFM expands, there must be a greater understanding of AFM techniques at all levels to better appreciate how AFM can be used for any particular application. Those requiring more than an entry-level understanding of AFM might include:
The online course is intended to be broadly accessible to beginning graduate students in any branch of science or engineering.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods builds on the Fundamentals of Atomic Force Microscopy, Part 1 course and requires familiarity with eigenvalue problems as well as calculus and partial differential equations.
Fundamentals of Atomic Force Microscopy, Part 2: Dynamic AFM Methods
This self-paced course is available at no cost to anyone with a nanoHUB.org account.
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