nanoHUB could be intermittently unavailable on 05/04 from 8:00 am – 1:00 pm (EST) for scheduled maintenance. All tool sessions will expire on 05/04 at 8:00 am (EST).
Find information on common issues.
Ask questions and find answers from other users.
Suggest a new site feature or improvement.
Check on status of your tickets.
Investigation of the Electrical Characteristics of Triple-Gate FinFETs and Silicon-Nanowire FETs
0.0 out of 5 stars
08 Aug 2006 | Online Presentations | Contributor(s): Monica Taba, Gerhard Klimeck
Top 1 shown