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1. Characterization of 2D materials at Birck Surface Analysis Facility

   28 Sep 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   Material characterization is an important aspect for various applications. In particularly, for 2D materials and nano-materials, the surface characterization becomes crucial for smart material design, functionalization, fabrication, etc. Surface Analysis Facility at Birck Nanotechnology Center,...

2. Nanotechnology for Aerospace Research: Surface Science Applications

   29 Mar 2016 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   Surface Analysis Facility at Birck Nanotechnology Center, Purdue University, equipped with state-of-art analytical equipment, which can greatly benefit many researchers from Schools of Engineering and College of Science. I would like to demonstrate examples of the studies using X-ray...

3. XPS Thickness Solver

   18 Dec 2011 | Tools | Contributor(s): Kyle Christopher Smith, David A Saenz, Dmitry Zemlyanov, Andrey Voevodin

   Helps the user to determine the thickness of an overlayer material from XPS experiment data.

4. BME 695L Special Lecture 2: X-ray Photoelectron Spectroscopy (XPS) in Biologically-Relevant Applications

   01 Nov 2011 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   Guest lecturer: Dmitry Zemlyanov

5. ECET 499N Lecture 9: XPS: X-ray Photoelectron Spectroscopy & ESCA: Electron Spectrometer for Chemical Analysis

   04 Mar 2010 | Online Presentations | Contributor(s): Dmitry Zemlyanov

   Guest Lecturer: Dmitry Zemlyanov

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