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Selective Silicon Epitaxy Seen at the Nanometer Scale
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14 Jun 2007 | Online Presentations | Contributor(s): Matthew Mark Sztelle
The presenter introduces NEMS (nanoelectromechanical systems) and STM (Scanning Tunneling Microscopy and continues to present material on Selective Silicon Epitaxy seen at the Nanometer ScaleMatthew M. Sztelle is a Research Assistant in the Scanning Tunneling Microscopy Group at the Beckman...
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