Selective Silicon Epitaxy Seen at the Nanometer Scale
14 Jun 2007 | Online Presentations | Contributor(s): Matthew Mark Sztelle
The presenter introduces NEMS (nanoelectromechanical systems) and STM (Scanning Tunneling Microscopy and continues to present material on Selective Silicon Epitaxy seen at the Nanometer ScaleMatthew M. Sztelle is a Research Assistant in the Scanning Tunneling Microscopy Group at the Beckman Institute for Advanced Science and Technology at the University of Illinois at Urbana-Champaign.Scanning Tunneling Microscopy Group
Beckman Institute for Advanced Science and Technology
University of ...