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How to Write a Journal Paper
13 Dec 2017 | Online Presentations | Contributor(s): Muhammad A. Alam
A Tutorial Introduction to Negative-Capacitor Landau Transistors: Perspectives on the Road Ahead
04 Dec 2015 | Online Presentations | Contributor(s): Muhammad A. Alam
In this talk, I use a simple graphical approach to demystify the device and explain why the experimental results are easy to misinterpret. Since the NC-FET is just a special case of a much broader class of phase-change devices and systems (e.g., transistors, memories, MEMS, logic-in-memory...
[Illinois] How to Break the "Fundamental" Limits of Nanobiosensing
07 Apr 2014 | Online Presentations | Contributor(s): Muhammad A. Alam
As the future of Moore’s law of transistor scaling appears uncertain, electronics is being reinvented by broadening the focus to other areas including macroelectronics (electronics of large, possibly flexible and transparent displays), bioelectronics (e.g., nanobio sensors for genomics,...
Sequencing a Genome by a Torrent of Ions: How an Old pH-Meter Got Its Groove Back
11 Apr 2014 | Online Presentations | Contributor(s): Muhammad A. Alam
The ability to read the book of life, written in the genome of an organism, has been one of the most exciting development of our time. The first version of human genome was announced circa 2000 and it took a decade of industrial-scale collaboration and billions of dollars of funding. Today, we...
nanoHUB-U: Principles of Nanoelectronic Biosensors Week One Scripts
10 Nov 2013 | Online Presentations | Contributor(s): Muhammad A. Alam
ECE 695A Lecture 40: Failure Analysis and Epilogue
07 May 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:Plan experiments, test carefully, and then post-mortemSummary: NBTI, HCI, TDDB, RadiationSummary: Measurement and Data AnalysisSummary: Why I work on this fieldConclusion
ECE 695A Lecture 39-1R: Review Questions
01 May 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What is the difference between hard and soft error?What is typical charge loss mechanism for ZRAM ?The soft error in Flash memory is different from that of ZRAM. Explain.How do people accelerate radiation induced damage? If carrier relaxation was faster than thermionic emission...
ECE 695A Lecture 39-1: Radiation and Devices I
Outline:Introduction to ZRAMSoft Errors in Zero-capacitor RAMSoft Errors in in Flash memoriesHard Errors and Anomalous leakage in Flash memoryConclusions
ECE 695A Lecture 38R: Review Questions
29 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 38: Charge Generation by Particles
ECE 695A Lecture 37R: Review Questions
ECE 695A Lecture 37: Effect of Radiation Induced Charge - Soft Errors
Outline:Sources of radiationBasics of charge generation and perturbation of potentialCharges and junctionsConclusions
ECE 695A Lecture 36R: Review Questions
29 Apr 2013 | Online Presentations | Contributor(s): R. Edwin Garcia, Muhammad Alam
Review Questions:Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?What type of radiation issues could arise for thin-body devices like FINFET?What is error correction code? Why does it correct for MBU?What is the difference between SEE...
ECE 695A Lecture 36: Radiation Induced Damage – an overview
ECE 695A Lecture 35R: Review Questions
24 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What role did Fisher play in developing the design of experiment?If you have 3 variables at two levels, what Taguchi array would you choose?How does one find correlation among variables in Full factorial method?What is the role of linear graphs in Taguchi method?In what ways...
ECE 695A Lecture 35: Design of Experiments
Outline:Context and backgroundSingle factor and full factorial methodOrthogonal vector analysis: Taguchi/Fisher modelCorrelation in dependent parametersConclusions
20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 37: Radiation Induced Damage – An overview
Outline:Introduction and short history of radiation damageRadiation damage in various types of componentsSources of radiationA basic calculation and simulation approachesConclusions
ECE 695A Lecture 34A: Appendix - Variability by Bootstrap Method
18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 34: Scaling Theory of Design of Experiments
Outline:IntroductionBuckingham PI TheoremAn Illustrative ExampleRecall the scaling theory of HCI, NBTI, and TDDBConclusions
ECE 695A Lecture 33R: Review Questions
Review Questions:With higher number of model parameters, you can always get a good fit – why should you minimize the number of parametersLeast square method is a subset of maximum likelihood approach to data fitting. Is this statement correct?What aspect of the distribution function does...
ECE 695A Lecture 33: Model Selection/Goodness of Fit
Outline:The problem of matching data with theoretical distributionParameter extractions: Moments, linear regression, maximum likelihoodGoodness of fit: Residual, Pearson, Cox, AkikaConclusion
ECE 695A Lecture 32R: Review Questions
17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution?What is the problem of using empirical distributions? What are the advantages?If you must choose an empirical distribution, what should be your criteria? (Nos. of...
ECE 695A Lecture 32: Physical vs. Empirical Distribution
Outline:Physical Vs. empirical distributionProperties of classical distribution functionMoment-based fitting of dataConclusions
ECE 695A Lecture 31R: Review Questions
15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What is the difference between parametric estimation vs. non-parametric estimation?What principle did Tacho Brahe’s approach assume?What is the difference between population and sample? When we collect data for TDDB or NBTI, what type of data are we collecting?What problem does...