ECE 695A Lecture 17R: Review Questions
01 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What is wrong with using C-V measurement methods exclusively for NBTI and HCI degradation?Why do people like to use C-V techniques? What method would you use for HCI measurement?HCI does not relax. Why would you still want to use on-the-fly type methods? (Hint: Think about Drain...
ECE 695A Lecture 11R: Review Questions
08 Feb 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:Does Einstein relationship hold for activated diffusion?People argue that the forward dissociation and reverse passivation have similar activation barriers. Would you support the argument?What assumption did I make regarding diffusion of H in SiO2 that makes the derivation...
ECE 695E Lecture 14: Physics-based Machine Learning
24 Jan 2019 | Online Presentations | Contributor(s): Muhammad A. Alam
Outline Why and what of physics-based machine learning Example 1: Dropping a ball in the real world Example 2: Lake temperature distribution Approach 2: Structural Equation Modeling Conclusions
Electronics From the Bottom Up: top-down/bottom-up views of length
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17 Aug 2007 | Online Presentations | Contributor(s): Muhammad A. Alam
When devices get small stochastic effects become important. Random dopant effects lead to uncertainties in a MOSFET’s threshold voltage and gate oxides breakdown is a random process. Even a concept as simple as “channel length” becomes uncertain. This short (20 min) talk, a footnote to the...
ECE 695A Lecture 22R: Review Questions
19 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 25R: Review Questions
27 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:Explain why percolation resistance is area independent?Why is the physical origin of the distribution of percolation resistance?How would the ratio of hard and soft breakdown change with an auxiliary parallel capacitor in constant voltage stress? Explain. What is the evidence...
ECE 695A Lecture 19R: Review Questions
04 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions::If a signal disappears from ESR because of negative-U configuration, can it be detected by SDR or EDSR methods?What is the relationship between Gauss and Tesla as units of magnetic field?Was the original SDR method for bulk or interface traps?What is the relationship between RTN...
ECE 695A Lecture 23R: Review Questions
ECE 695A Lecture 37R: Review Questions
20 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:Why is SOI more radiation hard compared to bulk devices? What do you feel about radiation hardness of FINFET?What type of radiation issues could arise for thin-body devices like FINFET?What is error correction code? Why does it correct for MBU?What is the difference between SEE...
ECE 695A Lecture 26R: Review Questions
28 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 32R: Review Questions
17 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:Why do people use Normal, log-normal, Weibull distributions when they do not know the exact physical distribution?What is the problem of using empirical distributions? What are the advantages?If you must choose an empirical distribution, what should be your criteria? (Nos. of...
ECE 695A Lecture 30R: Review Questions
08 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Outline:What is the difference between extrinsic vs. intrinsic breakdown?Does gas dielectric have extrinsic breakdown? Why or why not?What does ESD damage and the plasma damage to thin oxides?Can you explain the physical meaning of infant mortality ? How does it relate to yield of semiconductor...
Universality of NBTI-Induced Interface Trap Generation and Its Impact on ID Degradation in Strained/ Unstrained PMOS Transistors
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23 Dec 2008 | Online Presentations | Contributor(s): Ahmad Ehteshamul Islam, Muhammad A. Alam
Despite extensive use of strained technology, it is still unclear whether NBTI-induced NIT generation in strained transistors is substantially different from that of unstrained ones. Here, we present a comprehensive theory for NIT generation in strained/unstrained transistors and show its...
ECE 695A Lecture 29R: Review Questions
Review Questions:Mention a few differences between thick and thin oxide breakdown.Is breakdown in thick oxides contact dominated? Can I use AHI theory here?How does the Paschen’s cascade initiate?What does it mean to have a fractal dimension of 1.7 for 2D breakdown? Why does the number suggest...
ECE 695A Lecture 27R: Review Questions
29 Mar 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 38R: Review Questions
29 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
ECE 695A Lecture 39-1R: Review Questions
01 May 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What is the difference between hard and soft error?What is typical charge loss mechanism for ZRAM ?The soft error in Flash memory is different from that of ZRAM. Explain.How do people accelerate radiation induced damage? If carrier relaxation was faster than thermionic emission...
ECE 695A Lecture 31R: Review Questions
15 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What is the difference between parametric estimation vs. non-parametric estimation?What principle did Tacho Brahe’s approach assume?What is the difference between population and sample? When we collect data for TDDB or NBTI, what type of data are we collecting?What problem does...
ECE 695A Lecture 33R: Review Questions
18 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:With higher number of model parameters, you can always get a good fit – why should you minimize the number of parametersLeast square method is a subset of maximum likelihood approach to data fitting. Is this statement correct?What aspect of the distribution function does...
ECE 695A Lecture 35R: Review Questions
24 Apr 2013 | Online Presentations | Contributor(s): Muhammad Alam
Review Questions:What role did Fisher play in developing the design of experiment?If you have 3 variables at two levels, what Taguchi array would you choose?How does one find correlation among variables in Full factorial method?What is the role of linear graphs in Taguchi method?In what ways...
ECE 695E Lecture 13: Deep Learning, Karnaugh Mapping, and Unsupervised Classification
07 Jan 2019 | Online Presentations | Contributor(s): Muhammad A. Alam
OutlineIntroductionA two input, single and multiple perceptron problemBackpropagation and coefficient fittingMachine learning and Karnaugh mappingOther forms of Machine Learning (Unsupervised, optical, quantum)Conclusions
ECE 695E Lecture 2: Collecting and Plotting Data
02 Jan 2019 | Online Presentations | Contributor(s): Muhammad A. Alam
OutlineReview of the traditional statistical metricsParametric vs. Nonparametric informationPreparing data for projection: Hazen formulaPreparing data for projection: Kaplan formulaConclusions
ECE 695E Lecture 4: Model Selection and Goodness of Fit
OutlineThe problem of matching data with theoretical distributionParameter extractions: Moments, linear regression, maximum likelihoodGoodness of fit: Residual, Pearson, Cox, AkikaConclusion
ECE 695E Lecture 12: Basics of Machine Learning
OutlineMachine learning is an algorithm for “fast” curve fittingMachine learning and classification: Example 1Machine learning and classification: Example 2 Any function can be represented by machine learning approach Conclusions
ECE 695E Lecture 3: Physical and Empirical Distributions
OutlinePhysical Vs. empirical distributionProperties of classical distribution functionMoment-based fitting of dataConclusions